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Role of BIT in support system maintenance and availability

机译：BIT在支持系统维护和可用性中的作用

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The role of built in test (BIT) in electronic systems has grown in prominence with the advances in system complexity and concern over maintenance lifecycle costs of large systems. In an environment where standards drive system designs (and provide an avenue for focused advancement in technology), standards for BIT are very much in an evolutionary state. The reasons for advancing the effectiveness of BIT include reduced support overhead, greater, confidence in operation, and increased system availability. The cost of supporting military electronic systems (avionics, communications, and weapons systems) has driven much of the development in BIT technology. But what about the systems that support these end items that contain test and measurement instrumentation - such as automatic test equipment (ATE), simulators and avionics development suites? There has also been a beneficial effect on the maintenance and availability of these systems due to the infusion of BIT into their component assemblies. But the effect has been much more sporadic and fragmented. This paper looks at the state of BIT in test and measurement instruments, explain its affect on system readiness, and present ideas on how to improve BIT technologies and standards. This will not provide definitive answers to BIT development questions, since the factors that affect it are specific to the instrument itself. The topics covered in this paper are: definitions of built-in test, instrument BIT history, importance of BIT fault coverage and isolation in support systems, overview of BIT development process issues that limit the effectiveness of BIT Standards related to instrument BIT, making BIT more effective in support system maintenance and availability and conclusions.
机译：随着系统复杂性的提高以及对大型系统维护生命周期成本的关注，内置测试（BIT）在电子系统中的作用日益突出。在标准驱动系统设计的环境中（并为技术的重点发展提供了途径），BIT标准在很大程度上处于演进状态。提升BIT有效性的原因包括减少支持开销，增加支持，增强运营信心以及提高系统可用性。支持军事电子系统（航空电子，通信和武器系统）的成本驱动了BIT技术的大部分发展。但是，支持这些包含测试和测量仪器的最终产品的系统又如何呢？例如自动测试设备（ATE），模拟器和航空电子开发套件呢？由于将BIT注入其组件中，因此对这些系统的维护和可用性也产生了有益的影响。但是这种影响是零星的和零散的。本文着眼于测试和测量仪器中BIT的状态，解释其对系统就绪性的影响，并提出有关如何改进BIT技术和标准的想法。这不会为BIT开发问题提供明确的答案，因为影响它的因素是特定于工具本身的。本文涵盖的主题包括：内置测试的定义，仪器BIT的历史记录，BIT故障覆盖率和支持系统隔离度的重要性，概述BIT开发过程的问题，这些问题限制了与BIT相关的BIT标准的有效性，使BIT在支持系统维护，可用性和结论方面更有效。

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