首页> 外文期刊>IEEE Aerospace and Electronic Systems Magazine >DESC efforts for parts quality improvement
【24h】

DESC efforts for parts quality improvement

机译:DESC努力提高零件质量

获取原文
获取原文并翻译 | 示例
           

摘要

Some of the impact that the test program at the Defense Electronics Supply Center (DESC) is having on improving the quality of products being supplied to its customers is illustrated. DESC test program non-mil lot rejection rates were nearing 50% for discrete semiconductors tested in receiving inspection. The associated part reject rate was nearly 15%. The part reject rate for all federal supply classes (FSCs) being sampled is less than 1%. Plans to drive the defect rate toward 100 PPM are discussed. Data indicate an increase in the quality of DESC-sampled devices being supplied for the military services over the last few years. The test programs and the sampling and test requirements are described.
机译:举例说明了国防电子供应中心(DESC)的测试程序对改善向其客户提供的产品质量的影响。对于接受检验的分立半导体,DESC测试程序的非百万批次拒收率接近50%。相关零件的废品率接近15%。所采样的所有联邦供应类别(FSC)的零件拒收率均低于1%。讨论了将缺陷率提高到100 PPM的计划。数据表明,在过去几年中,用于军事服务的DESC采样设备的质量有所提高。描述了测试程序以及采样和测试要求。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号