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首页> 外文期刊>IEEE Aerospace and Electronic Systems Magazine >Smart BIT: a plan for intelligent built-in test
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Smart BIT: a plan for intelligent built-in test

机译：Smart BIT：智能内置测试计划

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摘要

A major factor influencing the readiness of today's highly electronics-driven weapons systems is the amount of time spent maintaining them. The attainment of a better understanding of the causes for intermittent and other ill-defined failure modes and development of a greater appreciation for the effect of both external and internal environmental factors on the fault behavior of electronic systems will help to improve the BIT (built-in test) performance. Smart BIT is the name applied to a program of research and development sponsored by Rome Air Development Center (RADC) to investigate, develop, and apply artificial-intelligence (AI) techniques to effect BIT improvement. An overview of that program, its contents and purposes is provided. Deficiencies in current BIT implementations and potential benefits of the Smart BIT program are presented. Components of this approach are discussed and supporting technology areas highlighted. The current plan for implementing this approach is given along with a scenario describing its potential form.
机译：影响当今高度电子驱动的武器系统准备就绪的主要因素是维护它们所花费的时间。更好地了解间歇性故障和其他不确定的故障模式的原因，以及对外部和内部环境因素对电子系统的故障行为的影响有了更大的认识，这将有助于改善BIT（测试中）的效果。 Smart BIT是罗马航空发展中心（RADC）赞助的一项研究与开发计划的名称，该计划旨在研究，开发和应用人工智能（AI）技术来实现BIT的改善。提供了该程序的概述，其内容和目的。介绍了当前BIT实施中的不足以及Smart BIT计划的潜在好处。讨论了此方法的组成部分，并重点介绍了支持技术领域。给出了实施此方法的当前计划以及描述其潜在形式的方案。

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