A Critical Examination of Receive and Transmit Scan Element Pattern for Phased Arrays

R. C. Hansen

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A Critical Examination of Receive and Transmit Scan Element Pattern for Phased Arrays

机译：对相控阵接收和发送扫描元件模式的严格检查

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The measurement of Scan Element Pattern by exciting only the center element is evaluated, both for gain at broadside and for behavior versus scan (normalized at broadside). A large dipole array of 50 x 50 elements is used in a 64 bit computer test bed, for calculations including mutual impedance. These results are compared with those where all elements are properly excited. A simple rigorous derivation of SEP including impedance mismatch is presented.

机译：通过仅激励中心元素来评估扫描元素图案的测量，包括宽边增益和行为与扫描的关系（宽边归一化）。在64位计算机测试台中使用50×50元素的大型偶极子阵列进行计算，包括互阻抗。将这些结果与适当激发所有元素的结果进行比较。提出了一个简单严格的SEP推导，包括阻抗失配。

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来源
《Applied Computational Electromagnetics Society journal》 |2006年第3期|p.299-304|共6页
作者
R. C. Hansen;
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作者单位

P.O. Box 570215 Tarzana, CA 91357;

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原文格式 PDF
正文语种 eng
中图分类电磁学、电动力学;
关键词
scan element pattern; phased arrays; array measurements;

机译：扫描元件图;相控阵;阵列测量;

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机译：应用加权的细化线性阵列和模式可重构元素来扩展毫米波微带相控阵的模式扫描范围
2. Appling Weighted Thinned Linear Array and Pattern Reconfigurable Elements to Extend Pattern Scanning Range of Millimeter Wave Microstrip Phased Array [J] . Yan-Ying Bai, Shaoqiu Xiao, Bing-Zhong Wang, Journal of Infrared, Millimeter, and Terahertz Waves . 2010,第1期

机译：应用加权的细化线性阵列和模式可重构元素来扩展毫米波微带相控阵的模式扫描范围
3. A Wideband, Scanning Array of Four-Arm Spiral Elements for Simultaneous Transmit and Receive [J] . Hovsepian Alexander, Alwan Elias A., Volakis John L. IEEE Antennas and Wireless Propagation Letters . 2020,第4期

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A Critical Examination of Receive and Transmit Scan Element Pattern for Phased Arrays

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