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Computational Performance of GTD-RT Applied for Evaluation of Electromagnetic Scattering on Rough Surfaces

机译:GTD-RT应用于粗糙表面电磁散射评估的计算性能

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摘要

In this paper, a new robust computational method that applies the geometrical theory of diffraction (GTD) in conjunction with the ray tracing (RT) technique is developed to evaluate the electromagnetic scattering pattern due to a plane wave represented as beam of parallel rays incident on a rough surface of quite arbitrary statistical parameters. The development of the proposed technique is explained in detail taking into consideration the generation of the geometrical model of the rough surface. The Fresnel reflection model is applied under the assumption of arbitrary electrical and optical properties of the rough surface material. Also the polarization of the plane wave primarily incident on the rough surface is taken into consideration. The algorithm developed in the present work accounts for multiple bounces of an incident ray and, hence, it can be considered arbitrary higher-order GTD-RT technique. The accuracy of the obtained results is verified through the comparison with the experimental measurements of the scattering pattern of a light beam incident on rough sheets with specific statistical properties. The numerical results of the present work are concerned with investigating the dependence of the scattering pattern on the surface roughness, refractive index, angle of incidence, and the resolution of the geometric model of the rough surface. Also, it is shown that, for limited resolution of the rough surface model, the accuracy of the calculated scattered field depends on the angle of incidence of the primary beam and the surface roughness.
机译:在本文中,开发了一种新的鲁棒计算方法,其与光线跟踪(RT)技术一起应用衍射(GTD)的几何理论,以评估电磁散射图案由于所示为平行光束的平面波而导致的电磁散射图案非常任意统计参数的粗糙表面。考虑到粗糙表面的几何模型的产生,详细解释了所提出的技术的发展。在粗糙表面材料的任意电气和光学性质的假设下应用菲涅耳反射模型。还考虑了主要入射在粗糙表面上的平面波的偏振。在本工作中开发的算法考虑了事件射线的多次反弹,因此可以被认为是任意高阶GTD-RT技术。通过比较所得到的结果的准确性通过与入射在具有特定统计特性的粗糙片上的光束的散射图案的实验测量来验证。本工作的数值结果涉及调查散射图案对表面粗糙度,折射率,入射角的依赖性以及粗糙表面几何模型的分辨率。此外,示出了,对于粗糙表面模型的有限分辨率,计算的散射场的精度取决于主光束的入射角和表面粗糙度。

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