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Multifrequency ESR Characterization of Paramagnetic Point Defects in Semiconducting Cubic BN Crystals

机译:半导体立方BN晶体顺磁点缺陷的多频ESR表征

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摘要

Low-frequency (X-band) electron spin resonance (ESR) investigations on commercially available large-grained cubic boron nitride (cBN) superabrasive powders of various coloration, combined with high-frequency (W-band) ESR measurements on oriented submillimeter-size single crystallites selected from the same powder samples, resulted in a clear identification of several types of paramagnetic point defects. The resulting spin Hamiltonian parameters describing the ESR spectra observed in the 3–293 K temperature range and the photosensitivity of the paramagnetic defects observed in amber-colored cBN samples are reported. It is shown that the nature of the paramagnetic centers depends on the color of the investigated samples and that, in many cases, uncontrolled impurities seem to be involved in their structure.
机译:对市售的各种颜色的大粒径立方氮化硼(cBN)超级磨料粉进行低频(X波段)电子自旋共振(ESR)研究,并结合定向亚毫米尺寸的高频(W波段)ESR测量从相同的粉末样品中选出的单晶可以清楚地识别出几种类型的顺磁点缺陷。报告了由此产生的自旋哈密顿参数,描述了在3–293 K温度范围内观察到的ESR光谱以及在琥珀色cBN样品中观察到的顺磁缺陷的光敏性。结果表明,顺磁中心的性质取决于所研究样品的颜色,而且在许多情况下,其结构似乎涉及不受控制的杂质。

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