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Optimal plan for Wiener constant-stress accelerated degradation model

机译：维纳恒应力加速降解模型的最优规划

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摘要

This paper explores inferential procedures for the Wiener constant-stress accelerated degradation model under degradation mechanism invariance. The exact confidence intervals are obtained for the parameters of the proposed accelerated degradation model. The generalized confidence intervals are also proposed for the reliability function and pth quantile of the lifetime at the normal operating stress level. In addition, the prediction intervals are developed for the degradation characteristic, lifetime and remaining useful life of the product at the normal operating stress level. The performance of the proposed generalized confidence intervals and the prediction intervals is assessed by the Monte Carlo simulation. Furthermore, a new optimum criterion is proposed based on minimizing the mean of the upper prediction limit for the degradation characteristic at the design stress level. The exact optimum plan is also derived for the Wiener accelerated degradation model according to the proposed optimal criterion. The proposed interval procedures and optimum plan are the free of the equal testing interval assumption. Finally, two examples are provided to illustrate the proposed interval procedures and exact optimum plan. Specifically, based on the degradation data of LEDs, some interval estimates of quantities related to reliability indicators are obtained. For the degradation data of carbon-film resistors, the optimal allocation of test units is derived in terms of the proposed optimal criterion.
机译：本文探讨了降解机制不变性下维纳恒应力加速降解模型的推理程序。获得所提出的加速降解模型的参数的确切置信区间。还提出了广义置信区间用于正常工作应力水平的寿命的可靠性函数和第Pattleiry。另外，在正常操作应力水平下，为劣化特性，寿命和剩余使用寿命而开发了预测间隔。通过蒙特卡罗模拟评估所提出的广义置信区间和预测间隔的性能。此外，基于最小化设计应力水平的降解特性的上预测极限的平均值来提出新的最佳标准。根据所提出的最佳标准，还导出了所提出的维纳加速劣化模型的确切最佳计划。所提出的间隔程序和最优计划是无同的测试间隔假设。最后，提供了两个示例以说明所提出的间隔程序和精确的最佳计划。具体地，基于LED的劣化数据，获得与可靠指示符相​​关的数量的一些间隔估计。对于碳膜电阻器的劣化数据，测试单元的最佳分配是根据所提出的最佳标准来得出的。

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