Intrinsic defect-mediated conduction and resistive switching in multiferroic BiFeO_3 thin films epitaxially grown on SrRuO_3 bottom electrodes

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• 来源
  《Applied Physics Letters》 |2016年第11期|112902.1-112902.5|共5页
• 作者

  Ji Hye Lee; Ji Hoon Jeon; Chansoo Yoon; Sangik Lee; Yeon Soo Kim; Tae Joon Oh; Young Heon Kim; Jinsu Park; Tae Kwon Song; Bae Ho Park;

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• 作者单位

  Division of Quantum Phases and Devices, Department of Physics, Konkuk University, Seoul 143-701, South Korea;

  Division of Quantum Phases and Devices, Department of Physics, Konkuk University, Seoul 143-701, South Korea;

  Division of Quantum Phases and Devices, Department of Physics, Konkuk University, Seoul 143-701, South Korea;

  Division of Quantum Phases and Devices, Department of Physics, Konkuk University, Seoul 143-701, South Korea;

  Division of Quantum Phases and Devices, Department of Physics, Konkuk University, Seoul 143-701, South Korea;

  Division of Quantum Phases and Devices, Department of Physics, Konkuk University, Seoul 143-701, South Korea;

  Korea Research Institute of Standards Science, Daejeon 305-304, South Korea;

  School of Materials Science and Engineering, Changwon National University, Gyeongnam 641-773, South Korea;

  School of Materials Science and Engineering, Changwon National University, Gyeongnam 641-773, South Korea;

  Division of Quantum Phases and Devices, Department of Physics, Konkuk University, Seoul 143-701, South Korea;

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