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A random matrix approach to detect defects in a strongly scattering polycrystal: How the memory effect can help overcome multiple scattering

机译：一种检测强散射多晶中缺陷的随机矩阵方法：记忆效应如何帮助克服多重散射

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摘要

We report on ultrasonic imaging in a random heterogeneous medium. The goal is to detect flaws embedded deeply into a polycrystalline material. A 64-element array of piezoelectric transmitters/receivers at a central frequency of 5 MHz is used to capture the Green's matrix in a backscattering configuration. Because of multiple scattering, conventional imaging completely fails to detect the deepest flaws. We utilize a random matrix approach, taking advantage of the deterministic coherence of the backscattered wave-field which is characteristic of single scattering and related to the memory effect. This allows us to separate single and multiple scattering contributions. As a consequence, we show that flaws are detected beyond the conventional limit, as if multiple scattering had been overcome.
机译：我们报告了随机异质介质中的超声成像。目的是检测深深嵌入多晶材料中的缺陷。中心频率为5 MHz的由64个元件组成的压电发射器/接收器阵列用于捕获反向散射配置中的格林矩阵。由于多重散射，常规成像完全无法检测出最深的缺陷。我们利用随机矩阵方法，利用了背向散射波场的确定性相干性，后者是单个散射的特征，并且与记忆效应有关。这使我们可以将单个和多个散射贡献分开。结果，我们表明检测到的缺陷超出了常规限制，就好像克服了多次散射一样。

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  • 来源
    《Applied Physics Letters》 |2014年第23期|234105.1-234105.4|共4页
  • 作者

    S. Shahjahan; A. Aubry; F. Rupin; B. Chassignole; A. Decode;

  • 作者单位

    EDF R&D, Materials and Mechanics of Components Department, EDF Lab Les Renardiires,77818 Moret sur Loing, France;

    Institut Langevin, ESPCI ParisTech, CNRS, Universite Paris Diderot-Paris 7,1 rue Jussieu,75005 Paris, France;

    EDF R&D, Materials and Mechanics of Components Department, EDF Lab Les Renardiires,77818 Moret sur Loing, France;

    EDF R&D, Materials and Mechanics of Components Department, EDF Lab Les Renardiires,77818 Moret sur Loing, France;

    Institut Langevin, ESPCI ParisTech, CNRS, Universite Paris Diderot-Paris 7,1 rue Jussieu,75005 Paris, France;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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