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In-situ optical transmission electron microscope study of exciton phonon replicas in ZnO nanowires by cathodoluminescence

机译:阴极发光法研究ZnO纳米线中激子声子复制体的原位光学透射电子显微镜

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摘要

The cathodoluminescence spectrum of single zinc oxide (ZnO) nanowires is measured by in-situ optical Transmission Electron Microscope. The coupling between exciton and longitudinal optical phonon is studied. The band edge emission varies for different excitation spots. This effect is attributed to the exciton propagation along the c axis of the nanowire. Contrary to free exciton emission, the phonon replicas are well confined in ZnO nanowire. They travel along the c axis and emit at the end surface. Bending strain increases the relative intensity of second order phonon replicas when excitons travel along the c-axis.
机译:通过原位光学透射电子显微镜测量单氧化锌(ZnO)纳米线的阴极发光光谱。研究了激子与纵向光子之间的耦合。带边缘发射对于不同的激发点而变化。该效应归因于激子沿纳米线的c轴传播。与自由激子发射相反,声子复制品完全限制在ZnO纳米线中。它们沿c轴行进并在端面发射。当激子沿c轴行进时,弯曲应变增加了二阶声子复制子的相对强度。

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