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首页> 外文期刊>Applied Physics Letters >Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole, and fluorene units
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Focused ion beam and field-emission microscopy of metallic filaments in memory devices based on thin films of an ambipolar organic compound consisting of oxadiazole, carbazole, and fluorene units

机译:基于由恶二唑,咔唑和芴单元组成的双极性有机化合物薄膜的存储器件中金属丝的聚焦离子束和场发射显微镜

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摘要

We report on the mechanism of operation of organic thin film resistive memory architectures based on an ambipolar compound consisting of oxadiazole, carbazole, and fluorene units. Cross-sections of the devices have been imaged by electron microscopy both before and after applying a voltage. The micrographs reveal the growth of filaments, with diameters of 50?nm–100?nm, on the metal cathode. We suggest that these are formed by the drift of aluminium ions from the anode and are responsible for the observed switching and negative differential resistance phenomena in the memory devices.
机译:我们报告了基于由恶二唑,咔唑和芴单元组成的双极性化合物的有机薄膜电阻式存储器架构的操作机理。在施加电压之前和之后,已经通过电子显微镜对装置的横截面进行了成像。显微照片揭示了金属阴极上直径为50?nm–100?nm的细丝的生长。我们建议这些是由铝离子从阳极的漂移形成的,并负责观察存储器件中的开关和负差分电阻现象。

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  • 来源
    《Applied Physics Letters》 |2013年第21期|1-4|共4页
  • 作者单位

    School of Engineering and Computing Sciences and Centre for Molecular and Nanoscale Electronics, Durham University, Durham DH1 3LE, United Kingdom|c|;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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