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Room temperature negative differential resistance characteristics of polar III-nitride resonant tunneling diodes

机译:极性III氮化物共振隧穿二极管的室温负差分电阻特性

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摘要

III-nitride resonant tunneling diodes (RTDs), consisting Al0.2Ga0.8N/GaN double-barrier (DB) active layers, were grown on c-plane lateral epitaxial overgrowth (LEO) GaN/sapphire and c-plane freestanding (FS) GaN. RTDs on both templates, fabricated into mesa diameters ranging from 5 to 35 μm, showed negative differential resistance (NDR) at room temperature. NDR characteristics (voltage and current density at NDR onset and current-peak-to-valley ratio) were analyzed and reported as a function of device size and substrate choice. Our results show that LEO RTDs perform as well as FS ones and DB active layer design and quality have been the bottlenecks in III-nitride RTDs.
机译:由Al0.2Ga0.8N / GaN双势垒(DB)有源层组成的III型氮化物共振隧穿二极管(RTD)在c面横向外延过生长(LEO)GaN /蓝宝石和c面独立式(FS)上生长氮化镓两个模板上的RTD制成台面直径范围为5到35μm,在室温下显示负负电阻(NDR)。分析了NDR特性(NDR起始时的电压和电流密度以及电流峰谷比),并将其报告为器件尺寸和基板选择的函数。我们的结果表明,LEO RTD的性能与FS相同,而DB有源层的设计和质量一直是III型氮化物RTD的瓶颈。

著录项

  • 来源
    《Applied Physics Letters》 |2010年第9期|P.092104-092104-3|共3页
  • 作者单位

    Department of Electrical Engineering and Computer Science, Center for Quantum Devices, Northwestern University, Evanston, Illinois 60208, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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