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Application of fundamental parameter approach using integrated backscattering intensity for X-ray fluorescence analysis

机译：基础参数方法应用基础参数方法对X射线荧光分析的集成反向散射强度

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摘要

The fundamental parameter (FP) approach, in which the both intensities of coherently (Rayleigh) and incoherently (Comp-ton) scattered primary radiation are added individually to estimate the 'dark matrix' of the analyzed specimen, is considered successful, especially for in situ element determination. However, the current energy resolution of the energy-dispersive X-ray fluorescence (EDXRF) spectrometer system is not yet high enough for two scattered peaks to appear without overlapping in general, and separating two peaks with each other yields reduced accuracy of analysis. The FP approach with only the integrated backscattering intensity added in place of both of the individual backscatter intensities is proposed for X-ray fluorescence (XRF) analysis of unknown specimen. The present results show that the weight fraction deviations are below 5%, which is much lower than the maximum error 10.79% of the results for four selected samples by using the previous BFP. Our determination of elements reveals Na, Mg, Al, and Si as hypothetical elements representing compositions SiO_2 and Al_2O_3, namely the main compositions of the gangue for the geological samples as a mineral ore.
机译：基本参数（FP）方法，其中连贯（瑞利）和不连贯（Comp-TON）散射的初级辐射的两个强度分别添加以估计分析的样本的“暗矩阵”，被认为是成功的，特别是在原位元素确定。然而，能量 - 色散X射线荧光（EDXRF）光谱仪系统的电流能量分辨率对于两种散射峰而没有足够高，通常通常在不重叠的情况下出现，并且将两个峰彼此分离产生的分析精度降低。仅添加到两种单独的反向散射强度的集成反向散射强度的FP方法是针对未知样本的X射线荧光（XRF）分析的单独反向散射强度。本结果表明，重量分数偏差低于5％，低于使用先前的BFP的四种选定样品的最大误差10.79％。我们对元素的测定揭示了Na，Mg，Al和Si作为代表组合物SiO_2和Al_2O_3的假设元素，即地质样品作为矿物质矿石的煤矸石的主要组成。

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  • 来源
    《Applied Physics》 |2020年第5期|318.1-318.5|共5页
  • 作者

    Hak-Son Jin; Chol Ri; Yon-Song Jong;

  • 作者单位

    Faculty of Energy Science Kim Il Sung University Pyongyang Democratic People's Republic of Korea;

    National Institute of Energy Science Pyongyang Democratic People's Republic of Korea;

    Faculty of Energy Science Kim Il Sung University Pyongyang Democratic People's Republic of Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    FP approach; XRF analysis; EDXRF spectrometer system; Integrated backscattering intensity;

    机译：FP方法;XRF分析;EDXRF光谱仪系统;集成后散射强度;

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