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Analytical Model for the Extraction of Flaw-Induced Current Interactions for SQUID NDE

机译:SQUID NDE缺陷感应电流相互作用的解析模型

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摘要

Incorporating an analytical approach to simulate the interaction of a series of long cracks and the induced current of a double-D excitation coil, we have developed a model-based method to do precise detection of the positions of the cracks in a metallic structure by using eddy-current superconducting quantum interference device (SQUID) nondestructive evaluation (NDE) measurements. Conventionally, the structure of the defects is found by iteratively solving a numerical forward problem, which is usually based on finite-element, boundary-element, or volume-integral method. This, however, incurs a heavy numerical burden, as every time the forward problem is to be solved, a rigorous numerical model should be inevitably employed to extract the complex distribution pattern of the induced current encountering defects of the structure. In this paper, an analytical approach is used for the modeling of the interaction of the induced current and a series of cracks in the sample. It duly considers the distribution of the induced current in the flawed samples, does not call for extremely high computational resource, and thus permits efficient NDE as the forward problem can be solved within a reasonable time. Here, a high- ${T}_{c}$ first-order radio-frequency SQUID gradiometer is employed as the magnetic sensor of the NDE system to scan the samples with different cracks. The accuracy of the proposed algorithm is verified by having the extracted shape of the defects obtained by applying the proposed algorithm on the SQUID NDE measurements against the actual cracks.
机译:结合分析方法来模拟一系列长裂纹和双D型励磁线圈的感应电流的相互作用,我们开发了一种基于模型的方法,通过使用以下方法精确检测金属结构中的裂纹位置涡流超导量子干涉仪(SQUID)无损评估(NDE)测量。通常,缺陷的结构是通过迭代求解数值正问题来找到的,该问题通常基于有限元,边界元或体积积分方法。然而,这带来了沉重的数值负担,因为每次要解决正向问题时,都不可避免地应采用严格的数值模型来提取遇到结构缺陷的感应电流的复杂分布模式。在本文中,一种分析方法用于对感应电流和样品中一系列裂纹的相互作用进行建模。它适当地考虑了有缺陷样品中感应电流的分布,不要求极高的计算资源,因此由于可以在合理的时间内解决正向问题而允许高效的NDE。在这里,使用高$ {T} _ {c} $一阶射频SQUID梯度仪作为NDE系统的磁传感器来扫描具有不同裂纹的样品。通过提取缺陷形状来验证所提出算法的准确性,该缺陷形状是通过将所提出算法应用在针对实际裂缝的SQUID NDE测量中而获得的。

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