Graphical '/> Optical anisotropy studies of silver nanowire/polymer composite films with Mueller matrix ellipsometry
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Optical anisotropy studies of silver nanowire/polymer composite films with Mueller matrix ellipsometry

机译：穆勒矩阵椭偏法研究银纳米线/聚合物复合膜的光学各向异性

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Graphical abstract Display Omitted Highlights • The orthogonal optical constants of AgNW/polymer composite film were determined. • Their anisotropy is correlated to the electrical anisotropy and morphology of the composite film. • The long axis of AgNW is preferably oriented in the direction lengthwise to the coated film. Abstract Silver nanowire (AgNW)/photosensitive polymer composite film fabricated by roll-to-roll die coating exhibits optical and electrical anisotropy, depending on the coating conditions. To clarify the relation between the optical anisotropy, the electrical anisotropy and the orientation of AgNWs, the orthogonal optical constants of the composite films were determined by Mueller matrix spectroscopic ellipsometry. Multiple-sample analysis of reflection mode Mueller matrix and polarized transmission data was performed assuming a three-layer model consisting of substrate/polymer layer/conductive layer. The effective optical constants of the conductive layer revealed that the localized surface plasmon resonances, which arise from electric oscillation of along the short axis of AgNW, are large in the crosswise direction where the sheet resistance is large. On the other hand, the surface plasmon resonance associated with the electric oscillation along the long axis of the AgNW is large in the lengthwise direction where the sheet resistance is small. It seems the optical and electrical anisotropy reflects the morphology of the composite film, where the long axis of AgNW is preferably oriented in the direction lengthwise to the coated film.
机译： 图形摘要 < ce：simple-para id =“ spar0035” view =“ all” /> 省略显示 突出显示 • < ce：para id =“ par0005” view =“ all”> AgNW /聚合物复合材料的正交光学常数 • 它们的各向异性与复合膜的电各向异性和形态有关。 < ce：label>• AgNW的长轴最好沿涂膜的长度方向取向。 < / ce：list-item> 摘要 通过卷对卷模头涂层制备的银纳米线（AgNW）/光敏聚合物复合膜表现出光学和电气各向异性，具体取决于涂覆条件。为了阐明光学各向异性，电各向异性和AgNWs的取向之间的关系，通过Mueller矩阵光谱椭偏法测定了复合膜的正交光学常数。假设由基材/聚合物层/导电层组成的三层模型进行了反射模式Mueller矩阵和偏振透射数据的多样本分析。导电层的有效光学常数表明，由沿着AgNW的短轴的电振荡引起的局部表面等离子体共振在薄层电阻大的横向方向上较大。另一方面，与沿着AgNW的长轴的电振荡相关的表面等离子体激元共振在薄层电阻小的纵向方向上较大。似乎光学和电学各向异性反映了复合膜的形态，其中AgNW的长轴最好沿涂膜的长度方向取向。 < / ce：抽象>

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