Graphical '/> Evaluation of the dielectric function of colloidal Cd_(1-x)Hg_xTe quantum dot films by spectroscopic ellipsometry
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Evaluation of the dielectric function of colloidal Cd_(1-x)Hg_xTe quantum dot films by spectroscopic ellipsometry

机译：椭偏光谱法评价Cd_（1-x）Hg_xTe胶体量子点薄膜的介电性能

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摘要

Graphical abstract Display Omitted Highlights • Structural and optical investigation of layer-by-layer films with CdHgTe quantum dots. • Determination of the dielectric function of the quantum dots from 0.7 to 6.5eV. • Taking into account surface roughness, the same dielectric function fits all films. • Quantum-confinement-related blue-shifts of interband transitions are observed. Abstract We report on the investigation by spectroscopic ellipsometry of films containing Cd1−xHgxTe alloy quantum dots (QDs). The alloy QDs were fabricated from colloidal CdTe QDs grown by an aqueous synthesis process followed by an ion-exchange step in which Hg2+ ions progressively replace Cd2+. For ellipsometric studies, several films were prepared on glass substrates using layer-by-layer (LBL) deposition. The contribution of the QDs to the measured ellipsometric spectra is extracted from a multi-sample, transmission and multi- angle-of-incidence ellipsometric data analysis fitted using standard multilayer and effective medium models that include surface roughness effects, modeled by an effective medium approximation. The relationship of the dielectric function of the QDs retrieved from these studies to that of the corresponding II–VI bulk material counterparts is presented and discussed.
机译： 图形摘要 < ce：simple-para id =“ spar0035” view =“ all” /> 省略显示 突出显示 • < ce：para id =“ par0005” view =“ all”>逐层结构和光学研究带有CdHgTe量子点的胶片。 • 确定从0.7到6.5的量子点的介电函数。 eV。 • 考虑到表面粗糙度，相同的介电函数适合所有电影。 • ce：abstract-sec> 摘要 我们通过椭圆偏振光谱法对包含Cd 1 - ce： hsp sp =“ 0.25” /> x Hg x Te合金量子点（QDs）。合金量子点是由胶态CdTe量子点制造而成的，该胶体量子点通过水合成工艺生长，然后进行离子交换步骤，其中Hg 2 + 离子逐渐取代Cd 2 + 。对于椭偏研究，使用层（LBL）沉积在玻璃基板上制备了几层膜。 QD对测得的椭偏光谱的贡献是从多样本，透射和多入射角椭偏数据分析中提取的，该数据使用标准的多层和有效的介质模型拟合而成，包括表面粗糙度效应，并通过有效的介质近似建模。提出并讨论了从这些研究中获得的量子点的介电函数与相应的II-VI散装材料对应物之间的关系。

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  • 来源
    《Applied Surface Science》 |2017年第ptab期|295-300|共6页
  • 作者

    A. Bejaoui; M.I. Alonso; M. Garriga; M. Campoy-Quiles; A.R. Goñi; F. Hetsch; S.V. Kershaw; A.L. Rogach; C.H. To; Y. Foo; J.A. Zapien;

  • 作者单位

    Department of Physics and Materials Science and Centre for Functional Photonics (CFP), City University of Hong Kong;

    Institut de Ciència de Materials de Barcelona, ICMAB-CSIC, Campus de la UAB;

    Institut de Ciència de Materials de Barcelona, ICMAB-CSIC, Campus de la UAB;

    Institut de Ciència de Materials de Barcelona, ICMAB-CSIC, Campus de la UAB;

    Institut de Ciència de Materials de Barcelona, ICMAB-CSIC, Campus de la UAB,ICREA, Passeig Lluís Companys 23;

    Department of Physics and Materials Science and Centre for Functional Photonics (CFP), City University of Hong Kong;

    Department of Physics and Materials Science and Centre for Functional Photonics (CFP), City University of Hong Kong;

    Department of Physics and Materials Science and Centre for Functional Photonics (CFP), City University of Hong Kong;

    Department of Physics and Materials Science and Centre for Functional Photonics (CFP), City University of Hong Kong;

    Department of Physics and Materials Science and Centre for Functional Photonics (CFP), City University of Hong Kong;

    Department of Physics and Materials Science and Centre for Functional Photonics (CFP), City University of Hong Kong;

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  • 关键词

    Cd1−xHgxTe; Colloidal quantum dots; Spectroscopic ellipsometry; Ion exchange; Dielectric function;

    机译：Cd1-xHgxTe;胶体量子点;椭偏光谱;离子交换;介电函数;

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