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Determination of adhesion forces between smooth and structured solids

机译:测定光滑固体与结构化固体之间的粘附力

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Surfaces tend to be made smoother in order to gain flatness or in order to fulfill the need for more precise and reproducible positioning of parts. Adhesion or even sticking of the surfaces is a major showstopper for these applications. There are several measures that can be taken in order to reduce spontaneous adhesion. Quantification of the effectiveness of the chosen solution is most often done using an atomic force microscope (AFM) with probes varying from 1 nm to 8 μm of contact diameter. A serious disadvantage in measuring adhesion by sharp tips is the wear of the tips. Sharp tips wear easily, resulting in undefined contact areas. When the real area of contact is not well defined, the quantification of the adhesion force is not significant. In the current study results of AFM measurements from literature with different tip diameters of colloidal probes are compared with AFM cantilevers with a plateau tip and using probes from large spheres using an alternative setup in combination with a Universal Nano-mechanical Analyzer (UNAT). Test results are shown. Another part of the study deals with a deliberately roughening of smooth surfaces to minimize (spontaneous) adhesion. Good agreement has been found with existing results.
机译:为了获得平整度或满足对零件的更精确和可再现的定位的需求,趋于使表面更光滑。对于这些应用,表面的粘附或什至粘附是主要的表现。为了减少自发粘附,可以采取几种措施。所选解决方案有效性的量化通常是使用原子力显微镜(AFM)进行的,探针的接触直径在1 nm至8μm之间变化。在通过锋利的尖端测量粘附力时的严重缺点是尖端的磨损。尖锐的尖端容易磨损,导致未定义的接触区域。当接触的实际面积没有很好地定义时,粘附力的量化并不重要。在当前的研究中,将来自胶体探针尖端直径不同的文献的AFM测量结果与具有高原尖端的AFM悬臂进行了比较,并使用了大球体的探针,并结合了通用纳米机械分析仪(UNAT)使用了另一种设置。显示测试结果。研究的另一部分涉及故意使光滑表面粗糙化以最大程度地减少(自发)附着力。已与现有结果达成良好协议。

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