Observation of new critical point in In_xAl_(1-x)As alloy using spectroscopic ellipsometry

著录项

• 来源
  《Applied Surface Science》 |2009年第4期|1031-1034|共4页
• 作者

  J.J. Yoon; T.H. Ghong; J.S. Byun; Y.J. Kang; Y.D. Kim; H.J. Kim; Y.C. Chang; J.D. Song;

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• 作者单位

  Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University, Seoul 130-701, Republic of Korea;

  Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University, Seoul 130-701, Republic of Korea;

  Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University, Seoul 130-701, Republic of Korea;

  Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University, Seoul 130-701, Republic of Korea;

  Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University, Seoul 130-701, Republic of Korea;

  Department of Physics, University of Illinois at Urbana-Champaign, Urbana-Champaign, IL 61801, USA;

  Department of Physics, University of Illinois at Urbana-Champaign, Urbana-Champaign, IL 61801, USA Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan;

  Center for Spintronics Research, Korea Institute of Science and Technology, Seoul 146-791, Republic of Korea;

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• 收录信息
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  ellipsometry; InAlAs; dielectric function; band calculation; LASTO;

  机译：椭圆仪InAlAs;介电功能频带计算;拉斯托;