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Application of X-ray photoelectron spectroscopy to characterization of Au nanoparticles formed by ion implantation into SiO_2

机译:X射线光电子能谱在表征离子注入SiO_2形成的金纳米颗粒中的应用

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摘要

In X-ray photoelectron spectroscopy (XPS) of Au nanoparticles, the width of 5d valence band changes with Au particle size. This enables us to estimate the size of Au nanoparticles by using XPS. In this work, the 5d-band width has been measured for Au nanoparticles formed by ion implantation into SiO_2. The 5d-band width is found to be correlated strongly with the Au concentration. As the Au concentration increases, the 5d-band width becomes larger, indicating that the Au nanoparticles with the larger size tend to be formed in the vicinity of the projected range of Au ions. This correlation agrees very well with the results from transmission electron microscopy.
机译:在金纳米粒子的X射线光电子能谱(XPS)中,5d价带的宽度随金的粒径而变化。这使我们能够使用XPS估算Au纳米颗粒的尺寸。在这项工作中,已经测量了通过离子注入SiO_2形成的Au纳米粒子的5d带宽。发现5d带宽度与Au浓度强烈相关。随着Au浓度的增加,5d能带宽度变大,表明倾向于在Au离子的投射范围附近形成具有较大尺寸的Au纳米颗粒。这种相关性与透射电子显微镜的结果非常吻合。

著录项

  • 来源
    《Applied Surface Science》 |2009年第4期|1061-1064|共4页
  • 作者单位

    Kyoto Institute of Technology, Department of Chemistry and Materials Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan;

    Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan;

    Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan;

    Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan;

    Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan;

    Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan;

    IMR, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendal 980-8577, Japan;

    Japan Atomic Energy Agency, 1233 Watanuki, Takasaki, Gunma 370-1292, Japan;

    Japan Atomic Energy Agency, 1233 Watanuki, Takasaki, Gunma 370-1292, Japan;

    Japan Atomic Energy Agency, Tokai, Ibaraki 319-1195, Japan;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    nanoparticle; X-ray photoelectron spectroscopy; au; SiO_2; valence band; ion implantation;

    机译:纳米粒子X射线光电子能谱;au;SiO_2;价带;离子注入;

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