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Topographic Characterization Of Glazed Surfaces

机译：釉面的地形特征

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Detailed characterization of surface microstructure, i.e. phase composition and surface geometry, has become an important criterion of glazed ceramics. Topographic characterization is an important parameter in, e.g. estimating the influence of additional films on the average roughness of a surface. Also, the microscaled and nanoscaled roughnesses correlate with the cleanability and the self-cleaning properties of the surfaces. In this work the surface geometry of several matte glazes were described by topography and roughness as given by whitelight confocal microscopy and atomic force microscopy. Different measuring parameters were compared to justify the usefulness of the techniques in giving a comprehensive description of the surface microstructure. The results suggest that confocal microscopy is well suited for giving reliable topographical parameters for matte surfaces with microscaled crystals in the surfaces. Atomic force microscopy was better suited for smooth surfaces or for describing the local topographic parameters of closely limited areas, e.g. the surroundings of separate crystals in the surface.
机译：表面微观结构的详细表征，即相组成和表面几何形状，已成为釉面陶瓷的重要标准。地形特征是例如估计附加膜对表​​面平均粗糙度的影响。同样，微米级和纳米级粗糙度与表面的可清洁性和自清洁性能相关。在这项工作中，通过表面形貌和粗糙度（由白光共聚焦显微镜和原子力显微镜给出）描述了几种哑光釉的表面几何形状。比较了不同的测量参数以证明该技术在全面描述表面微观结构方面的有用性。结果表明，共聚焦显微镜非常适合为表面具有微米级晶体的无光泽表面提供可靠的形貌参数。原子力显微镜更适合用于光滑表面或用于描述紧密受限区域的局部形貌参数，例如表面上独立晶体的周围。

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