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Xps Characterization Of Sensitized N-tio_2 Thin Films For Dye-sensitized Solar Cell Applications

机译:用于染料敏化太阳能电池的敏化N-tio_2薄膜的Xps表征

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摘要

TiO_2 thin films, employed in dye-sensitized solar cells, were prepared by the sol-gel method or directly by Degussa P25 oxide and their surfaces were characterized by X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The effect of adsorption of the cis-[Ru(dcbH_2)_2(NCS)_2] dye, N3, on the surface of films was investigated. From XPS spectra taken before and after argon-ion sputtering procedure, the surface composition of inner and outer layers of sensitized films was obtained and a preferential etching of Ru peak in relation to the Ti and N ones was identified. The photoelectrochemical parameters were also evaluated and rationalized in terms of the morphological characteristics of the films.
机译:通过溶胶-凝胶法或直接通过Degussa P25氧化物制备用于染料敏化太阳能电池的TiO_2薄膜,并通过X射线光电子能谱(XPS)和扫描电子显微镜(SEM)对它们的表面进行表征。研究了顺-[Ru(dcbH_2)_2(NCS)_2]染料N3在膜表面的吸附作用。从在氩离子溅射过程之前和之后获得的XPS光谱,获得了敏化膜内层和外层的表面组成,并确定了相对于Ti和N优先腐蚀的Ru峰。还根据膜的形态特征评估了光电化学参数并使其合理化。

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