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首页> 外文期刊>Applied Surface Science >Structural Study Of Thin Films Prepared From Tungstate Glass Matrix By Raman And X-ray Absorption Spectroscopy
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Structural Study Of Thin Films Prepared From Tungstate Glass Matrix By Raman And X-ray Absorption Spectroscopy

机译：钨酸玻璃基薄膜拉曼光谱和X射线吸收光谱的结构研究

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Thin films were prepared using glass precursors obtained in the ternary system NaPO_3-BaF_2-WO_3 and the binary system NaPO_3-WO_3 with high concentrations of WO_3 (above 40% molar). Vitreous samples have been used as a target to prepare thin films. Such films were deposited using the electron beam evaporation method onto soda-lime glass substrates. Several structural characterizations were performed by Raman spectroscopy and X-ray Absorption Near Edge Spectroscopy (XANES) at the tungsten L_Ⅰ and L_Ⅲ absorption edges. XANES investigations showed that tungsten atoms are only sixfold coordinated (octahedral WO_6) and that these films are free of tungstate tetrahedral units (WO_4). In addition, Raman spectroscopy allowed identifying a break in the linear phosphate chains as the amount of WO_3 increases and the formation of P-O-W bonds in the films network indicating the intermediary behavior of WO_6 octahedra in the film network. Based on XANES data, we suggested a new attribution of several Raman absorption bands which allowed identifying the presence of W-O~- and W=O terminal bonds and a progressive apparition of W-O-W bridging bonds for the most WO_3 concentrated samples (above 40% molar) attributed to the formation of WO_6 clusters.
机译：使用在三元体系NaPO_3-BaF_2-WO_3和二元体系NaPO_3-WO_3中获得的具有高浓度WO_3（高于40％摩尔浓度）的玻璃前体制备薄膜。玻璃样品已被用作制备薄膜的靶。使用电子束蒸发法将这些膜沉积在钠钙玻璃基板上。通过拉曼光谱和X射线吸收近边缘光谱（XANES）在钨的L_Ⅰ和L_Ⅲ吸收边缘进行了几个结构表征。 XANES研究表明，钨原子只有六重配位（八面体WO_6），并且这些薄膜不含钨酸盐四面体单元（WO_4）。另外，拉曼光谱法允许鉴定线性磷酸酯链的断裂，因为WO_3的量增加并且在膜网络中形成P-O-W键，表明WO_6八面体在膜网络中的中间行为。根据XANES数据，我们提出了几个拉曼吸收带的新属性，这些特征带可以识别WO_-和W = O末端键的存在，并且可以对大多数WO_3浓缩样品（摩尔浓度大于40％）逐步鉴定WOW桥键。归因于WO_6簇的形成。

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