Study of buried Si(111)-5 × 2-Au by surface X-ray diffraction

Yusaku Iwasawa; Wolfgang Voegeli; Tetsuroh Shirasawa; Kouji Sekiguchi; Takehiro Nojima; Ryuji Yoshida; Toshio Takahashi; Masuaki Matsumoto; Tatsuo Okano; Koichi Akimoto; Hiroshi Kawata; Hiroshi Sugiyama

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Study of buried Si(111)-5 × 2-Au by surface X-ray diffraction

机译：表面X射线衍射研究Si（111）-5×2-Au的埋藏

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摘要

The structure of buried Si(111)-5 × 2-Au capped with amorphous Si was investigated using surface X-ray diffraction. It was found that the 5 × 2 structural periodicity is kept under the amorphous Si from the in-plane measurement. Furthermore, the intensity variation along the fractional-order rod indicates that Au atoms are located almost on the same plane.

机译：利用表面X射线衍射研究了覆盖有非晶硅的掩埋Si（111）-5×2-Au的结构。通过面内测量发现在非晶Si下保持5×2的结构周期性。此外，沿分数阶棒的强度变化表明Au原子几乎位于同一平面上。

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来源
《Applied Surface Science》 |2008年第23期|p.7803-7806|共4页
作者
Yusaku Iwasawa; Wolfgang Voegeli; Tetsuroh Shirasawa; Kouji Sekiguchi; Takehiro Nojima; Ryuji Yoshida; Toshio Takahashi; Masuaki Matsumoto; Tatsuo Okano; Koichi Akimoto; Hiroshi Kawata; Hiroshi Sugiyama;
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作者单位

Institute for Solid State Physics, University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8581, Japan;

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原文格式 PDF
正文语种 eng
中图分类应用物理学;
关键词
Si(111)-5 × 2-Au; surface X-ray diffraction; buried interface;

机译：Si（111）-5×2-Au;表面X射线衍射;埋藏界面;

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1. Reflectance anisotropy studies of 5 × 2-Au structures grown on Si(111) surfaces with different step formations [J] . J. Jacob, N. McAlinden, K. Fleischer, Physica status solidi . 2008,第8期

机译：在具有不同台阶形式的Si（111）表面上生长的5×2-Au结构的反射各向异性研究
2. Effect of C_(60) layer on the growth mode and conductance of Au and Ag films on Si(111)√31/2-Au and Si(111)√31/2-Ag surfaces [J] . D. A. Tsukanov, M. V. Ryzhkova, E. A. Borisenko, Journal of Applied Physics . 2011,第9期

机译：C_（60）层对Si（111）√31/ 2-Au和Si（111）√31/ 2-Ag表面上Au和Ag薄膜的生长模式和电导率的影响
3. Structural study of Si(111)-6 × 1-Ag surface using surface X-ray diffraction [J] . Kazushi Sumitani, Kosuke Masuzawa, Takashi Hoshino, Surface Science . 2007,第22期

机译：表面X射线衍射研究Si（111）-6×1-Ag表面的结构
4. Roughening of Au(111) Surfaces During Ion Beam Erosion: A Scanning Tunneling Microscope and X-Ray Diffraction Study [C] . A. Judy, M.V. Ramana Murty, E. Butler, Symposium on Epitaxial Growth--Principles and Applications held April 5-8, 1999, San Francisco, California, U.S.A. . 1999

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5. Growth and structure of ultra-thin epitaxial chromium and iron oxide films on silver(001) and silver(111): A comprehensive study accomplished by x-ray photoelectron diffraction and low energy electron diffraction. [D] . Ozturk, Osman. 2002

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6. Erratum: Following the molecular motion of near-resonant excited CO on Pt(111): A simulated x-ray photoelectron diffraction study based on molecular dynamics calculations Struct. Dyn. 2 035102 (2015) [O] . Michael Greif, Tibor Nagy, Maksym Soloviov, 2016

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7. An X-Ray Diffraction Study of the Reconstructions Induced by Sn and Pb on Ge(111) Surfaces [O] . Pedersen J.S. 1988

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8. X-ray Diffraction Study of the Reconstructions Induced by Sn and Pb on Ge(111) Surfaces [R] . Skov Pedersen, J. 1988

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Study of buried Si(111)-5 × 2-Au by surface X-ray diffraction

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