...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Applied Surface Science >Birefringence measurements of MnPc thin film by polarization microscopy
【24h】

Birefringence measurements of MnPc thin film by polarization microscopy

机译：MnPc薄膜的双折射偏振显微镜测量

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

We have studied optical properties of near-infrared (NIR) spectra and birefringence of the manganese phthalocyanine (MnPc) thin films. The morphology of the MnPc thin film grown on KC1 (001) substrates was observed by using an atomic force microscope. The NIR spectral range of 1.0-1.7 μm was studied in this study, because that of 1.3-1.5 μm is known as an optical communication wavelength. The birefringence was measured with changing the growth condition of a deposition rate and a substrate temperature. The birefringence of the film was most affected by the deposition rate.
机译：我们已经研究了近红外（NIR）光谱的光学特性和锰酞菁（MnPc）薄膜的双折射。通过使用原子力显微镜观察在KC1（001）衬底上生长的MnPc薄膜的形貌。在本研究中研究了1.0-1.7μm的NIR光谱范围，因为1.3-1.5μm的NIR光谱范围被称为光通信波长。通过改变沉积速率和衬底温度的生长条件来测量双折射。薄膜的双折射受沉积速率的影响最大。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号