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Effect of Ge surface termination on oxidation behavior

机译:Ge表面终止对氧化行为的影响

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Sulfur-termination was formed on the Ge(100) surface using (NH_4)_2S solution. Formation of Ge-S and the oxidation of the S-terminated Ge surface were monitored with multiple internal reflection Fourier transform infrared spectroscopy and X-ray photoelectron spectroscopy. In the 0.5, 5, or 20% (NH_4)_2S solution, H-termination on the Ge(100) surface was substituted with S-termination in 1 min. When the S-terminated Ge(100) surface was exposed in air ambient, the oxidation was retarded for about 3600 min. The preservation time of the oxide layer up to one monolayer of S-terminated Ge(100) surface was about 120 times longer than for the H-terminated Ge(100) surface. However, the oxidation of S-terminated Ge(100) surface drastically increased after the threshold time. There was no significant difference in threshold time between S-terminations formed in 0.5,5, and 20% (NH_4)_2S solutions. With the surface oxidation, desorption of S on the Ge surface was observed. The desorption behavior of sulfur on the S-terminated Ge(100) surface was independent of the concentration of the (NH_4)_2S solution that forms S-termination. Non-ideal S-termination on Ge surfaces may be related to drastic oxidation of the Ge surface. Finally, with the desulfurization on the S-terminated Ge(100) surface, oxide growth is accelerated.
机译:使用(NH_4)_2S溶液在Ge(100)表面形成了硫终止反应。用多次内反射傅里叶变换红外光谱和X射线光电子能谱监测Ge-S的形成和S端接的Ge表面的氧化。在0.5%,5%或20%(NH_4)_2S溶液中,Ge(100)表面上的H终止在1分钟内被S终止取代。当S端接的Ge(100)表面暴露在空气环境中时,氧化被延迟了大约3600分钟。直至S端接Ge(100)表面单层的氧化物层的保存时间比H端接Ge(100)表面的保存时间长约120倍。但是,阈值时间后,S端Ge(100)表面的氧化急剧增加。在0.5、5和20%(NH_4)_2S溶液中形成的S终止之间的阈值时间没有显着差异。通过表面氧化,观察到S在Ge表面上的解吸。硫在S末端Ge(100)表面上的解吸行为与形成S末端的(NH_4)_2S溶液的浓度无关。 Ge表面的非理想S端接可能与Ge表面的剧烈氧化有关。最后,随着S末端Ge(100)表面的脱硫作用,氧化物的生长被加速。

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