Molecular Depth Profiling Of Trehalose Using A C_(60) Cluster Ion Beam

Andreas Wucher; Juan Cheng; Nicholas Winograd

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Molecular Depth Profiling Of Trehalose Using A C_(60) Cluster Ion Beam

机译：使用C_（60）簇离子束对海藻糖进行分子深度分析

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Molecular depth profiling of organic overlayers was performed using a mass selected fullerene ion beam in conjunction with time-of-flight (TOF-SIMS) mass spectrometry. The characteristics of depth profiles acquired on a 300-nm trehalose film on Si were studied as a function of the impact kinetic energy and charge state of the C_(60) projectile ions. We find that the achieved depth resolution depends only weakly upon energy.

机译：使用质量选择的富勒烯离子束结合飞行时间（TOF-SIMS）质谱仪进行有机覆盖层的分子深度分析。研究了在Si上的300 nm海藻糖膜上获得的深度分布特征，该特征是C_（60）弹丸离子的冲击动能和电荷态的函数。我们发现所达到的深度分辨率仅在很小程度上取决于能量。

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来源
《Applied Surface Science》 |2008年第4期|p.959-961|共3页
作者
Andreas Wucher; Juan Cheng; Nicholas Winograd;
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作者单位

Department of Physics, University of Duisburg-Essen, D-47048 Duisburg, Germany;

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原文格式 PDF
正文语种 eng
中图分类应用物理学;
关键词
molecular depth profiling; 3d imaging; depth scale calibration;

机译：分子深度剖析;3D成像;深度尺度校准;

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专利

1. Molecular Depth Profiling Using a C_(60) Cluster Beam: The Role of Impact Energy [J] . Andreas Wucher, Juan Cheng, Nicholas Winograd The journal of physical chemistry, C. Nanomaterials and interfaces . 2008,第42期

机译：使用C_（60）簇束的分子深度剖析：冲击能的作用
2. Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C60) cluster ions [J] . Lu C., Wucher A., Winograd N. Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2011,第1a2期

机译：使用buckminsterfullerene（C60）团簇离子在海藻糖膜分子深度分析中的电离效应
3. The Effect Of C_(60) Cluster Ion Beam Bombardment In Sputter Depth Profiling Of Organic-inorganic Hybrid Multiple Thin Films [J] . Hyun Kyong Shon, Tae Geol Lee, Dahl Hyun Kim, Applied Surface Science . 2008,第4期

机译：C_（60）簇离子束轰击在有机-无机杂化多层薄膜溅射深度分析中的作用
4. VIBRATIONAL SPECTRA AND MOLECULAR STRUCTURE OF THE HYDROFULLERENES C_(60)H_(18), C_(60)D_(18), AND C_(60)H_(36) AS STUDIED BY IR AND RAMAN SPECTROSCOPY AND FIRST-PRINCIPLE CALCULATIONS [C] . A.A. POPOV, V.V. SENYAVIN, A.A. GRANOVSKY, NATO Advanced Research Workshop on Hydrogen Materials Science and Chemistry of Carbon Nanomaterials; 20030914-20; Sudak, Crimea(UA) . 2003

机译：红外和拉曼光谱及第一性原理研究的富勒烯C_（60）H_（18），C_（60）D_（18）和C_（60）H_（36）的振动光谱和分子结构
5. Molecular depth profiling and wedge-crater beveling with ToF-SIMS and cluster ion beams [D] . Mao, Dan 2011

机译：使用ToF-SIMS和簇离子束进行分子深度分析和楔形坑斜切
6. Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C60) cluster ions [O] . C. Lu, A. Wucher, N. Winograd -1

机译：使用鼠标蛋白（C60）簇离子在海藻糖膜的分子深度分析中的电离效应
7. ToF-SIMS depth profiling of trehalose: the effect of analysis beam dose on the quality of depth profiles [O] . Shin Muramoto, Jeremy Brison, David G. Castner 2010

机译：TOF-SIMS深度分析海藻糖：分析梁剂量对深度剖面质量的影响
8. Use of Similarity Profiles in Studying Cluster Formation in Molecular Beams: Evidence for the Role of Pre-Existing Dimers [R] . Mark, T. D., Castleman, A. W., Breen, J. J., 1984

机译：利用相似谱研究分子束中的团簇形成：预先存在的二聚体作用的证据

Molecular Depth Profiling Of Trehalose Using A C_(60) Cluster Ion Beam

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