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首页> 外文期刊>Applied Surface Science >Molecular Ion Yield Enhancement Induced By Gold Deposition In Static Secondary Ion Mass Spectrometry
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Molecular Ion Yield Enhancement Induced By Gold Deposition In Static Secondary Ion Mass Spectrometry

机译：静态二次离子质谱法中金沉积诱导的分子离子产率提高

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摘要

Static ToF-SIMS was used to evaluate the effect of gold condensation as a sample treatment prior to analysis. The experiments were carried out with a model molecular layer (Triacontane M = 422.4 Da), upon atomic (In~+) and polyatomic (Bi_3~+) projectile bombardment. The results indicate that the effect of molecular ion yield improvement using gold metallization exists only under atomic projectile impact. While the quasi-molecular ion (M+Au)~+ signal can become two orders of magnitude larger than that of the deprotonated molecular ion from the pristine sample under In~+ bombardment, it barely reaches the initial intensity of (M-H)~+ when Bi_3~+ projectiles are used. The differences observed for mono- and polyatomic primary ion bombardment might be explained by differences in near-surface energy deposition, which influences the sputtering and ionization processes.
机译：在分析之前，使用静态ToF-SIMS评估金冷凝作为样品处理的效果。实验是在原子（In〜+）和多原子（Bi_3〜+）弹丸轰击下，使用模型分子层（Triacontane M = 422.4 Da）进行的。结果表明，利用金金属化提高分子离子收率的效果仅在原子弹撞击下存在。在In〜+轰击下，准分子离子（M + Au）〜+信号比原始样品中去质子化的分子离子的信号大两个数量级，但它几乎达不到（MH）〜+的初始强度。当使用Bi_3〜+弹丸时。单原子和多原子一次离子轰击所观察到的差异可以用近表面能量沉积的差异来解释，这会影响溅射和电离过程。

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