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首页> 外文期刊>Applied Surface Science >Formation Of Znte By Stacked Elemental Layer Method
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Formation Of Znte By Stacked Elemental Layer Method

机译：堆叠元素层法形成Znte

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摘要

Zn-Te bilayer thin films have been deposited on well-cleaned glass substrate using vacuum thermal evaporation technique under a vacuum of 5 × 10~(-5 )Torr. These bilayer films have been modified by Swift heavy ion (SHI) irradiation, vacuum thermal annealing (VTA) and rapid thermal annealing (RTA). Characterization of ZnTe bilayer thin films have been performed by X-ray diffraction, optical reflectance, atomic force microscopy (AFM) and X-ray fluorescence (XRF) measurements. Irradiated ZnTe bilayer thin films have been obtained in cubic phase, Optical band gap values have been found in between the range of ZnTe compound. Increased surface roughness has been observed in irradiated films, compositional analysis has been confirmed by XRF measurements.
机译：Zn-Te双层薄膜已经在真空度为5×10〜（-5）Torr的真空热蒸发技术下沉积在清洁良好的玻璃基板上。这些双层膜已通过快速重离子（SHI）辐照，真空热退火（VTA）和快速热退火（RTA）进行了改性。 ZnTe双层薄膜的表征已通过X射线衍射，光学反射率，原子力显微镜（AFM）和X射线荧光（XRF）测量进行了。在立方相中获得了辐照的ZnTe双层薄膜，发现光学带隙值在ZnTe化合物的范围之间。在辐照过的薄膜中观察到表面粗糙度增加，通过XRF测量证实了组成分析。

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