Non-contact AFM observation of the (3~(1/2) x 3~(1/2) to (3 x 3) phase transition on Sn/Ge(111) and Sn/Si(111) surfaces

Insook Yi; Ryuji Nishi; Yoshiaki Sugimoto; Seizo Morita

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Non-contact AFM observation of the (3~(1/2) x 3~(1/2) to (3 x 3) phase transition on Sn/Ge(111) and Sn/Si(111) surfaces

机译：Sn / Ge（111）和Sn / Si（111）表面上（3〜（1/2）x 3〜（1/2）到（3 x 3）相变的非接触AFM观察

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摘要

The (3~(1/2) x 3~(1/2))to(3 x 3) phase transition in Sn/Ge(111)-(3~(1/2) x 3~(1/2))R30° and Sn/Si(111)-(3~(1/2) x 3~(1/2))R30° systems was investigated for the first time using a non-contact atomic force microscope (NC-AFM). Observations show the occurrence of the phase transition with small (3 x 3) domains on the Sn/Ge(111) surface at low temperatures of 78 and 6 K. However, no evidence was found to support the presence of the phase transition for the Sn/Si( 1 1 1) system, even when the temperature was lowered to 6 K. The (3x3) domains present two patterns, one hexagonal and the other honeycomb, depending on the tip to sample distance.

机译：Sn / Ge（111）-（3〜（1/2）x 3〜（1/2）中的（3〜（1/2）x 3〜（1/2））至（3 x 3）相变使用非接触原子力显微镜（NC-AFM）首次研究了R30°和Sn / Si（111）-（3〜（1/2）x 3〜（1/2））R30°系统。观察结果表明，在78和6 K的低温下，在Sn / Ge（111）表面上出现了具有小（3 x 3）畴的相变。但是，没有发现证据表明存在相变。 Sn / Si（1 1 1）系统，即使温度降低到6 K也是如此。（3x3）磁畴呈现两种模式，一个为六边形，另一个为蜂窝状，具体取决于针尖到样品的距离。

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来源
《Applied Surface Science》 |2007年第6期|3072-3076|共5页
作者
Insook Yi; Ryuji Nishi; Yoshiaki Sugimoto; Seizo Morita;
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作者单位

Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita-shi, Osaka 565-0871, Japan;

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原文格式 PDF
正文语种 eng
中图分类应用物理学;
关键词
Sn/Ge(11 1); Sn/Si(11 1); phase transition; non-contact atomic force microscope (NC-AFM); low temperature; (3~(1/2) x 3~(1/2)) phase; (3 x 3) phase;

机译：锡/锗（11 1）;锡/硅（11 1）;相变非接触原子力显微镜（NC-AFM）;低温;（3〜（1/2）x 3〜（1/2））相;（3 x 3）阶段;

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Non-contact AFM observation of the (3~(1/2) x 3~(1/2) to (3 x 3) phase transition on Sn/Ge(111) and Sn/Si(111) surfaces

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