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Effects of SnO_2 surface coating on the degradation of ZnS thin film phosphor

机译:SnO_2表面涂层对ZnS薄膜荧光粉降解的影响

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Pulsed laser deposited ZnS bare and SnO_2 coated ultra thin films were subjected to prolonged electron beam bombardment with 2 keV energy and a steady 44 mA/cm~2 current density, in 1 × 10~(-6) Torr O_2 pressure backfilled from a base pressure of 3 × 10~(-9) Torr at room temperature. Auger electron spectroscopy (AES) was used to monitor changes of the surface chemical composition of both the bare and coated phosphor films during electron bombardment. Degradation was manifested by the decrease of sulphur and accumulation of oxygen on the surface of the bare phosphor. However, with the SnO_2 coating this phenomenon was delayed until the protective SnO_2 was depleted on the surface through dissociation and reduction.
机译:在从基座回填的1×10〜(-6)Torr O_2压力下,以2 keV能量和稳定的44 mA / cm〜2电流密度对脉冲激光沉积的ZnS裸露和SnO_2涂覆的超薄膜进行长时间的电子束轰击室温下压力为3×10〜(-9)Torr。使用俄歇电子能谱(AES)来监视电子轰击过程中裸露和涂覆的荧光粉膜的表面化学组成的变化。通过在裸露的磷光体表面上的硫减少和氧的积累来表明降解。然而,对于SnO_2涂层,该现象被延迟,直到通过解离和还原使保护性SnO_2在表面上耗尽为止。

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