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Microstructural Characterization Of La_(0.4)sr_(0.6)co_(0.8)fe_(0.2)o_(3-δ) Films deposited By Dip Coating

机译:浸涂沉积La_(0.4)sr_(0.6)co_(0.8)fe_(0.2)o_(3-δ)薄膜的微观结构表征

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摘要

The dip-coating method has been successfully used for depositing porous electrodes of La_(0.4)Sr_(0.6)Co_(0.8)Fe_(0.2)O_(3-δ) (LSCF) films. Perovskite oxide cobaltites powders have been prepared by an acetic acid-based gel route. Then, cathode films were deposited onto ceramic substrates of the usual electrolyte Cerium Gadolinium Oxide (CGO) by dip coating. The structure and morphology of the powders and films were characterized by X-ray, diffraction (XRD) and scanning electron microscopy (SEM) respectively, to study the correlation between microstructure and deposition parameters. Optimum parameters for obtaining continuous, homogeneous and crack free LSCF films were determined.
机译:浸涂法已成功用于沉积La_(0.4)Sr_(0.6)Co_(0.8)Fe_(0.2)O_(3-δ)(LSCF)膜的多孔电极。钙钛矿氧化物钴粉已经通过基于乙酸的凝胶路线制备。然后,通过浸涂将阴极膜沉积到通常的电解质氧化铈Ga(CGO)的陶瓷基板上。分别通过X射线,衍射(XRD)和扫描电子显微镜(SEM)对粉末和薄膜的结构和形貌进行表征,以研究其微观结构与沉积参数之间的关系。确定了获得连续,均匀和无裂纹的LSCF膜的最佳参数。

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