Ⅰ-Ⅴ curve oscillation observed by atomic force microscopy

L.X. Li; R.P. Liu; C.Z. Fan; M.Y. Lv; J. Li; W.K. Wang

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Ⅰ-Ⅴ curve oscillation observed by atomic force microscopy

机译：原子力显微镜观察Ⅰ-Ⅴ曲线的振荡

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Oscillation on the current-voltage curve measured by atomic force microscopy is observed when the distance between the tip and sample is large enough and beyond a critical value. The appearance of the oscillation is attributed to the excitation of electron standing waves between the tip and sample. From the first peak position and the voltage difference between the first two peaks on the current-voltage curve, the value of the work function at the detected point on silver film surface and the distance between the tip and the detected point can be calculated.

机译：当尖端和样品之间的距离足够大且超过临界值时，观察到通过原子力显微镜测量的电流-电压曲线上的振荡。振荡的出现归因于尖端和样品之间电子驻波的激发。根据第一峰值位置和电流-电压曲线上的前两个峰值之间的电压差，可以计算出银膜表面上的检测点处的功函数值以及尖端与检测点之间的距离。

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来源
《Applied Surface Science》 |2006年第16期|p.5803-5807|共5页
作者
L.X. Li; R.P. Liu; C.Z. Fan; M.Y. Lv; J. Li; W.K. Wang;
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作者单位

Key Laboratory of Metastable Materials Science and Technology, Yanshan University, Qinhuangdao 066004, PR China;

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原文格式 PDF
正文语种 eng
中图分类应用物理学;
关键词
oscillation on current—voltage curve; atomic force microscopy; electron standing wave; work function;

机译：电流振荡—电压曲线;原子力显微镜;电子驻波;功函数;

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Ⅰ-Ⅴ curve oscillation observed by atomic force microscopy

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