ToF-SIMS analysis of a fluorocarbon-grafted PET with a gold cluster ion source

Zhu ZM; Kelley MJ

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ToF-SIMS analysis of a fluorocarbon-grafted PET with a gold cluster ion source

机译：含金簇离子源的氟碳接枝PET的ToF-SIMS分析

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Cluster ions have been recognized as a superb primary species in time of flight secondary ion mass spectroscopy (ToF-SIMS) compared with monatomic primary ions, as they significantly enhance the secondary ion yields from bulk samples. Self-assembled monolayers provide an important system for studying the fundamental mechanism involved in the yield enhancement.

机译：与单原子一次离子相比，簇离子在飞行时间二次离子质谱（ToF-SIMS）中被公认为是一流的一次物种，因为它们显着提高了大体积样品的二次离子产率。自组装单层膜为研究提高产量的基本机理提供了重要的系统。

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来源
《Applied Surface Science》 |2006年第19期|p. 6619-6623|共5页
作者
Zhu ZM; Kelley MJ;
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作者单位

Coll William & Mary, Dept Appl Sci, Appl Res Ctr 601, Newport News, VA 23606 USA;

Thomas Jefferson Natl Accelerator Facil, Free Electron Laser Dept, Newport News, VA 23606 USA;

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原文格式 PDF
正文语种 eng
中图分类应用物理学;
关键词
SIMS; cluster ion; polymer; monolayer; surface analysis; sputter cross-section; 172 NM IRRADIATION; MOLECULAR-DYNAMICS; BOMBARDMENT; POLY(ETHYLENE-TEREPHTHALATE); SIMULATIONS; EMISSION; PROJECTILES; SURFACES; IMPACTS; BEAM;

机译：SIMS;簇离子;聚合物;单层;表面分析;溅射横截面;172 NM辐射;分子动力学;轰击;聚对苯二甲酸乙二酯;模拟;排放;项目;表面;注入;束;

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3. Comparison of detection efficiencies of negatively charged gold-alkanethiolate-, gold-sulfur- and gold-clusters in ToF-SIMS [J] . Rietmann T, Sohn S, Schroder M, Applied Surface Science . 2006,第19期

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ToF-SIMS analysis of a fluorocarbon-grafted PET with a gold cluster ion source

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