Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

Boschmans B; Vanneste M; Ruys L; Temmerman E; Leys C; Van Vaeck L

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Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

机译：大气等离子体处理的聚丙烯薄膜的静态二次离子质谱（S-SIMS）分析

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摘要

Time-of-Flight (TOF) static secondary ion mass spectrometry (S-SIMS) was used to gain molecular information on the surface modifications introduced by plasma treatment of polypropylene (PP) films. A procedure using slotted electron microscopy grids was developed to deal with the charge build-up of samples with a thickness of about 30 mu m. The surface composition was studied as a function of the plasma treatment time. A comparison of the mass spectra from untreated and treated PP showed significant differences of signal intensities of ions that could be specifically related to the presence of oxygen-containing species. (c) 2006 Elsevier B.V. All rights reserved.

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来源
《Applied Surface Science》 |2006年第19期|p. 6660-6663|共4页
作者
Boschmans B; Vanneste M; Ruys L; Temmerman E; Leys C; Van Vaeck L;
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作者单位

Univ Antwerp CDE, Dept Chem, B-2610 Antwerp, Belgium;

Centexbel, B-9052 Zwijnaarde, Belgium;

Univ Ghent, Dept Appl Phys, B-9000 Ghent, Belgium;

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原文格式 PDF
正文语种 eng
中图分类应用物理学;
关键词
TOF S-SIMS; atmospheric plasma; polypropylene; charge build-up; surface modification; SURFACE MODIFICATION; PRESSURE PLASMA;

机译：TOF S-SIMS;大气等离子体;聚丙烯;电荷积累;表面改性;表面改性;压力等离子体;

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专利

1. Static secondary ion mass spectrometry (S-SIMS) in advanced textile research: Study of additives in polypropylene (PP) films [J] . Boschmans B, Vanneste M, Ruys L, Applied Surface Science . 2006,第19期

机译：静态二次离子质谱（S-SIMS）在高级纺织品研究中的应用：聚丙烯（PP）薄膜中添加剂的研究
2. Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS) [J] . De Mondt R, Adriaensen L, Vangaever F, Applied Surface Science . 2006,第19期

机译：静态二次离子质谱（S-SIMS）对有机化合物分析中金属沉积的实证评估
3. Comparison of Ga+ and SF5+ primary ions for the molecular speciation of oxysalts in static secondary ion mass spectrometry (S-SIMS) [J] . Van Ham R, Van Vaeck L, Adams F, Journal of Analytical Atomic Spectrometry . 2005,第10期

机译：静态二次离子质谱（S-SIMS）中Ga +和SF5 +初级离子在含氧盐分子形成中的比较
4. Study Of Oxygen Plasma Treated Gan Film Using X-Ray Photoelectron Spectroscopy (XPS) And Secondary Ion Mass Spectrometry (SIMS) [C] . B. R. Chakraborty, S. M. Shivaprasad, S. Pal, International Workshop on the Physics of Semiconductor Devices . 2002

机译：X射线光电子谱（XPS）和二次离子质谱法（SIMS）研究氧等离子体处理GaN膜
5. Characterization of adsorbed protein films using time of flight secondary ion mass spectrometry and multivariate analysis. [D] . Wagner, Matthew Scott. 2002

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机译：阳离子交换树脂在静态和动态念珠菌生物膜中提取细胞外基质超高效液相色谱-串联四极杆飞行时间质谱（UPLC-Q-TOF-MS）对基质代谢物进行无目标分析
7. Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films [O] . Boschmans, Bart, Vanneste, Myriam, Ruys, Luc, 2006

机译：大气等离子体处理的聚丙烯薄膜的静态二次离子质谱（S-SIMS）分析
8. Application of Static Secondary Ion Mass Spectrometry to Trace Evidence Analysis [R] . Groenewold, G. S. 2000

机译：静态二次离子质谱在痕量证据分析中的应用

Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

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