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首页> 外文期刊>Applied Surface Science >Implementing a SIMS ion source on the NRL trace element accelerator mass spectrometer
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Implementing a SIMS ion source on the NRL trace element accelerator mass spectrometer

机译：在NRL痕量元素加速器质谱仪上实现SIMS离子源

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The NRL trace element accelerator mass spectrometer facility has recently added a modified Cameca IMS 6F SIMS instrument as a high-performance ion source, providing the advantages of accelerator mass spectrometry to SIMS analysis. These advantages include removal of molecular interferences, a greatly reduced background, and composition analysis using molecular ions (after breaking them into atomic constituents before detection). This last feature compensates for a requirement to use only negative secondary ions, as it enables measurement of electropositive elements. In addition, the NRL facility provides for parallel mass analysis, thus improving isotope ratio precision and practical sensitivity. Spatial analysis of the sample is still provided by raster of the primary Cs beam. The modified Cameca includes the Cs primary column, sample chamber, and the secondary ion column up to the standard electrostatic analyzer. The NRL accelerator facility supplants the normal mass spectrometer portion of the IMS 6F instrument. Additional recent facility upgrades provide improved mass spectrometry performance, both for a prior radiocarbon ion source and the now installed SIMS. An example measurement, using silver ions, demonstrates the system's capabilities. Published by Elsevier B.V.
机译：NRL痕量元素加速器质谱仪设施最近添加了改良的Cameca IMS 6F SIMS仪器作为高性能离子源，为SIMS分析提供了加速器质谱的优势。这些优势包括消除分子干扰，大大减少的本底以及使用分子离子的成分分析（在将其分解为原子成分之后再进行检测）。最后一个功能补偿了仅使用负二次离子的要求，因为它可以测量正电元素。此外，NRL设施还提供了平行质量分析功能，从而提高了同位素比精度和实用灵敏度。样品的空间分析仍由主Cs光束的光栅提供。改进的Cameca包括Cs一级色谱柱，样品室和二级离子色谱柱，直至标准静电分析仪。 NRL加速器设施取代了IMS 6F仪器的常规质谱仪部分。对于先前的放射性碳离子源和现在安装的SIMS，最近的其他设施升级都改善了质谱仪的性能。使用银离子的示例测量演示了系统的功能。由Elsevier B.V.发布

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