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Molecular depth profiling of multi-layer systems with cluster ion sources

机译：具有簇离子源的多层系统的分子深度分析

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Cluster bombardment of molecular films has created new opportunities for SIMS research. To more quantitatively examine the interaction of cluster beams with organic materials, we have developed a reproducible platform consisting of a well-defined sugar film (trehalose) doped with peptides. Molecular depth profiles have been acquired with these systems using C-60(+) bombardment. In this study, we utilize this platform to determine the feasibility of examining buried interfaces for multi-layer systems. Using C-60(+) at 20 keV, several systems have been tested including Al/trehalose/Si, Al/trehalose/Al/Si, Ag/trehalose/Si and ice/trehalose/Si. The results show that there can be interactions between the layers during the bombardment process that prevent a simple interpretation of the depth profile. We find so far that the best results are obtained when the mass of the overlayer atoms is less than or nearly equal to the mass of the atoms in buried molecules. In general, these observations suggest that C-60(+) bombardment can be successfully applied to interface characterization of multi-layer systems if the systems are carefully chosen. (c) 2006 Elsevier B.V. All rights reserved.
机译：分子膜的团簇轰击为SIMS研究创造了新的机会。为了更定量地检查簇状束与有机材料的相互作用，我们开发了一个可重现的平台，该平台由掺有肽的清晰糖膜（海藻糖）组成。这些系统使用C-60（+）轰击获得了分子深度分布图。在这项研究中，我们利用该平台来确定检查多层系统的掩埋接口的可行性。使用20 keV的C-60（+），已测试了多个系统，包括Al /海藻糖/ Si，Al /海藻糖/ Al / Si，Ag /海藻糖/ Si和冰/海藻糖/ Si。结果表明，在轰击过程中各层之间可能存在相互作用，从而无法简单解释深度剖面。到目前为止，我们发现，当覆盖层原子的质量小于或接近等于埋入分子中原子的质量时，可获得最佳结果。通常，这些观察结果表明，如果精心选择C-60（+）轰击可以成功地应用于多层系统的界面表征。 （c）2006 Elsevier B.V.保留所有权利。

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