首页> 外文期刊>Applied Surface Science >Characterization of oxide thin films using optical techniques
【24h】

Characterization of oxide thin films using optical techniques

机译:使用光学技术表征氧化物薄膜

获取原文
获取原文并翻译 | 示例
           

摘要

Thin films of oxide materials are Playing a growing role as critical elements in optoelectronic devices and nanoscale devices. In this work, thin films of some typical oxides such as WO3, Ga2O3 and SrTiO3 were investigated. We present measurements of those films, using various optical techniques like photoconductivity transients over a wide time range and photo-Hall measurements. Analysis of the photo-Hall and photoconductivity data permits the determination of the contribution to the photoconductivity made by the carrier mobility and concentration. A model for dispersive carrier transport was proposed to explain the relaxation of the photoconductivity in oxide thin films. In addition, photoluminescence characterization was used to study microstructures and energy band in oxide thin films. The broad emission from oxide host, consisting of several band peaks, Wag likely due to a recombination process with several possible paths. The dependence of the luminescent intensity on the annealing atmosphere was associated with the presence of oxygen vacancies. It is suggested that our optical analysis efforts have improved the understanding of oxide thin films, and this should lead to the necessary advancements in a variety of devices. (c) 2006 Elsevier B.V. All rights reserved.
机译:氧化物材料的薄膜作为光电器件和纳米级器件中的关键元素正在发挥越来越重要的作用。在这项工作中,研究了一些典型氧化物如WO3,Ga2O3和SrTiO3的薄膜。我们使用各种光学技术(例如,在很宽的时间范围内的光电导瞬变和光霍尔测量)来介绍这些膜的测量。对光霍尔和光电导率数据的分析允许确定由载流子迁移率和浓度对光电导率的贡献。提出了一种用于分散载流子传输的模型来解释氧化物薄膜中光电导率的弛豫。另外,利用光致发光特性研究了氧化物薄膜的微观结构和能带。来自氧化物主体的宽发射,由几个能带峰组成,可能是由于具有多个可能路径的重组过程所致。发光强度对退火气氛的依赖性与氧空位的存在有关。建议我们的光学分析工作已经改善了对氧化物薄膜的理解,这将导致各种设备的必要进步。 (c)2006 Elsevier B.V.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号