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Nano-localized desorption and time-of-flight mass analysis using solely optical enhancement in the proximity of a scanning tunneling microscope tip

机译:仅使用光学增强技术在扫描隧道显微镜尖端附近进行纳米定位解吸和飞行时间质量分析

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摘要

The combination of scanning tunneling microscopy (STM) with time-of-flight mass system (TOF-MS) adds new information to STM imaging. In this study, an STM system has been combined with laser excitation and was used for desorption and ionization of surface molecules, without the use of any other external stimulus. Desorbed ions from confined areas were accelerated and detected by a TOF chamber. We demonstrate in this paper that the technique proposed enables desorption of superficial structures within a small area of approximately 5 nm diameter and simultaneous mass spectroscopy of the desorbed atoms. (C) 2003 Elsevier Science B.V. All rights reserved. [References: 10]
机译:扫描隧道显微镜(STM)与飞行时间质谱系统(TOF-MS)的结合为STM成像增加了新的信息。在这项研究中,STM系统已与激光激发相结合,被用于表面分子的解吸和电离,而无需使用任何其他外部刺激。来自密闭区域的解吸离子被加速并由TOF室检测。我们在本文中证明,所提出的技术能够在约5 nm直径的小区域内解吸表面结构,并同时对解吸的原子进行质谱分析。 (C)2003 Elsevier Science B.V.保留所有权利。 [参考:10]

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