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An automatic optical inspection system for measuring a microlens array with an optical interferometric microscope and genetic algorithm

机译:用光学干涉显微镜和遗传算法测量微透镜阵列的自动光学检查系统

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摘要

Purpose - The purpose of this paper is to propose an automatic optical inspection system for measuring the surface profile of a microlens array. Design/methodology/approach - The system set-up was constructed according to the principle of the Fizeau interferometer. After capturing the ring interference fringe images of the microlens with a camera, the diameter, profile information and optical properties were analyzed through a microlens surface profile algorithm using innovative image pre-processing with a precision of less than 0.09 micron. Findings - By integrating with the genetic algorithm, the XY-Table shortest moving path of the system is calculated to achieve the purpose of highspeed inspection and automatic irNcrolens array surface profile measurement. Originality/value - The measurement results of this system were also compared with other systems, including the atomic force microscope and stylus profiler, to verif^lhe measurement precision and accuracy of this system.
机译:目的-本文的目的是提出一种用于测量微透镜阵列表面轮廓的自动光学检查系统。设计/方法/方法-系统设置是根据Fizeau干涉仪的原理构建的。用照相机捕获微透镜的环形干涉条纹图像后,使用微透镜表面轮廓算法,使用创新的图像预处理技术,以小于0.09微米的精度分析直径,轮廓信息和光学特性。发现-通过与遗传算法集成,计算出系统的XY工作台最短移动路径,以达到高速检查和自动irNcrolens阵列表面轮廓测量的目的。原创性/价值-还将该系统的测量结果与其他系统(包括原子力显微镜和测针轮廓仪)进行比较,以验证该系统的测量精度和准确性。

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