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Piezoresistive effect in carbon nanotube films

机译:碳纳米管薄膜的压阻效应

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摘要

The piezoresistive effect of the pristine carbon nanotube (CNT) films has been studied. Carbon nanotubes were synthesized by hot filament chemical vapor deposition. The piezoresistive effect in the pristine CNT films was studied by a three-point bending test. The gauge factor for the pristine CNT films under 500 microstrains was found to be at least 65 at room temperature, and increased with temperature, exceeding that of polycrystalline silicon (30) at 35 ℃. The origin of the piezoresistivity in CNT films may be ascribed to a pressure-induced change in the band gap and the defects.
机译:研究了原始碳纳米管(CNT)膜的压阻效应。碳纳米管通过热丝化学气相沉积法合成。通过三点弯曲试验研究了原始CNT膜中的压阻效应。发现在500微应变下原始CNT薄膜的规格系数在室温下至少为65,并且随温度增加而增加,超过了35℃的多晶硅(30)。 CNT膜中压阻的起源可能归因于带隙和缺陷的压力诱导变化。

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