...
首页> 外文期刊>Combustion Science and Technology >EMISSION IMAGING OF AP/HTPB PROPELLANT SANDWICH COMBUSTION
【24h】

EMISSION IMAGING OF AP/HTPB PROPELLANT SANDWICH COMBUSTION

机译:AP / HTPB推进剂夹心燃烧的排放成像

获取原文
获取原文并翻译 | 示例
           

摘要

Ultraviolet emission imaging (305-315 nm) was used to study the combustion of sandwiches of ammonium perchlorate (AP) and hydroxyl-terminated polybutadiene (HTPB) in nitrogen at pressures up to 32 atm, with binder layers from 50 to 450 μm in thickness. The emission imaging was combined with a novel backlighting technique to allow determination of the corresponding surface shape during combustion. The results indicated that the interface regression rate of IPDI-cured samples undergoing laser-assisted deflagration (120 W/cm~2 average flux) is nearly independent of the binder thickness for binders thicker than 100 μm. The pressure exponent of the regression rate is 0.31 up to 15 atm, then increases with pressure from 15 to 32 atm. Two primary flame regimes were identified: a regime of high Peclet and Damkoehler numbers which exhibits a split base in the ultraviolet flame emission, and a regime of low Peclet and Damkoehler numbers which exhibits a merged flame base. A third, "lifted" flame region, in which the strongest flame emission starts several hundred microns above the solid surface, occurs with low Damkoehler numbers and high Peclet numbers. The effects of Pe and binder oxygenation (by fine-AP) on the size of the diffusion flame and the location of its leading edges relative to the AP/binder interface were observed to be in agreement with Shvab-Zeldovich theory.
机译:紫外线发射成像(305-315 nm)用于研究高氯酸铵(AP)和羟基封端的聚丁二烯(HTPB)三明治在氮气中在高达32 atm的压力下的燃烧,粘合剂层的厚度为50至450μm 。发射成像与新型背光技术相结合,可以确定燃烧过程中相应的表面形状。结果表明,对于厚度大于100μm的粘合剂,IPDI固化样品进行激光辅助爆燃(120 W / cm〜2平均通量)的界面回归速率几乎与粘合剂厚度无关。回归速率的压力指数在15个大气压下为0.31,然后随着压力从15个大气压增加到32个大气压而增加。确定了两个主要的火焰状态:高Peclet和Damkoehler数的状态在紫外火焰中显示出分裂的碱,以及低Peclet和Damkoehler数的状态显示出合并的火焰基。第三个“升起”火焰区域出现在其中,最强的火焰发射开始于固体表面上方几百微米处,其Damkoehler数低而Peclet数高。观察到Pe和粘合剂的氧合(通过精细AP)对扩散火焰的尺寸及其前缘相对于AP /粘合剂界面的位置的影响与Shvab-Zeldovich理论一致。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号