• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>IEEE Communications Magazine >Test: shared problems and shared solutions
【24h】

Test: shared problems and shared solutions

机译：测试：共享的问题和共享的解决方案

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Test is a universal problem-common to all sectors of the electronics and IT industries. However, significantly different solutions have been required in the past-dictated by factors including the complexity of the product under test and the extent to which features to support test could economically be designed into the product. The latter was a particular problem at the integrated circuit level where, for a long time, the amount of circuitry available within each component was limited. Today, what were once large and complex systems are now single integrated circuits. It has become both economical and technically desirable to deploy test approaches that were once relevant only to, say, mainframe computers to the testing of circuit boards, integrated circuits, and even parts of integrated circuits. Put simply, "systems on silicon" demand system-oriented test approaches. The goal of this article is to illustrate this point and to highlight the commonalities between what at first glance may appear to be different approaches to test applied at different levels of integration.
机译：测试是普遍存在的问题，在电子和IT行业的所有部门中都很常见。但是，过去受各种因素的影响，要求的解决方案明显不同，这些因素包括被测产品的复杂性以及可以经济地将测试功能设计到产品中的程度。后者是集成电路级别的一个特殊问题，长期以来，每个组件中可用的电路数量受到限制。如今，曾经庞大而又复杂的系统现在变成了单个集成电路。部署曾经只与大型机相关的测试方法在电路板，集成电路甚至集成电路部件的测试中，从经济上和技术上都是合乎需要的。简而言之，“系统在硅上”需要面向系统的测试方法。本文的目的是说明这一点，并强调乍看之下似乎是在不同集成级别应用的不同测试方法之间的共性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号