首页> 外文期刊>Composite Structures >The FEM analysis of FGM piezoelectric semiconductor problems
【24h】

The FEM analysis of FGM piezoelectric semiconductor problems

机译:FGM压电半导体问题的有限元分析

获取原文
获取原文并翻译 | 示例
           

摘要

The finite element method is developed for 3-D general boundary value problems for a piezoelectric semiconductor with functionally graded material properties. The electron density and electric current are additionally considered in the constitutive equations for piezoelectric semiconductors. A general variation of material properties with Cartesian coordinates is treated in the numerical analyses. The influence of material parameter gradation and initial electron density is investigated in the static case. Numerical results are presented" for a 3-D beam under a static and impact mechanical load. Transversely isotropic material properties are considered in this study. (C) 2016 Elsevier Ltd. All rights reserved.
机译:针对具有功能梯度材料特性的压电半导体的3-D一般边值问题,开发了有限元方法。在压电半导体的本构方程中还考虑了电子密度和电流。数值分析处理了具有笛卡尔坐标的材料特性的一般变化。在静态情况下,研究了材料参数等级和初始电子密度的影响。给出了“在静态和冲击机械载荷下的3-D梁的数值结果。在此研究中考虑了横向各向同性的材料特性。(C)2016 Elsevier Ltd.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号