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首页> 外文期刊>IEEE Transactions on Computers >On Minimizing Internal Data Migrations of Flash Devices via Lifetime-Retention Harmonization
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On Minimizing Internal Data Migrations of Flash Devices via Lifetime-Retention Harmonization

机译：通过寿命保留协调最小化闪光设备的内部数据迁移

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摘要

With the emerge of high-density triple-level-cell (TLC) and 3D NAND flash, the access performance and endurance of flash devices are degraded due to the downscaling of flash cells. In addition, we observe that the mismatch between data lifetime requirement and flash block retention capability could further worsen the access performance and endurance. This is because the "lifetime-retention mismatch" could result in massive internal data migrations during garbage collection and data refreshing, and further aggravate the already-worsened access performance and endurance of high-density NAND flash devices. Such an observation motivates us to resolve the lifetime-retention mismatch problem by proposing a "time harmonization strategy", which coordinates the flash block retention capability with the data lifetime requirement to enhance the performance of flash devices with very limited endurance degradation. Specifically, this study aims to lower the amount of internal data migrations caused by garbage collection and data refreshing via storing data of different lifetime requirement in flash blocks with suitable retention capability. The trace-driven evaluation results reveal that the proposed design can effectively reduce the average response time by about 99 percent on average without sacrificing the overall endurance, as compared with the state-of-the-art designs.
机译：随着高密度三级单元（TLC）和3D NAND闪光的出现，由于闪存单元的缩小，闪光装置的访问性能和耐久性降低。此外，我们观察到数据寿命需求和闪电块保持能力之间的不匹配可以进一步恶化访问性能和耐久性。这是因为在垃圾收集和数据刷新期间可能导致大规模的内部数据迁移，并进一步加剧了高密度NAND闪存器件的已经恶化的访问性能和耐久性。这样的观察激励我们通过提出“时间协调策略”来解决寿命保留不匹配问题，该问题与数据寿命要求协调，以增强具有非常有限的耐久性降级的闪光装置的性能。具体而言，本研究旨在通过存储具有适当的保留能力的闪光灯块中的不同寿命要求的数据来降低由垃圾收集和数据刷新引起的内部数据迁移量。跟踪驱动的评估结果表明，与最先进的设计相比，所提出的设计可以平均将平均响应时间减少约99％，而不会牺牲整体耐力。

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