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Quantitative Evaluation of Polarized Emissivity and Polarized Reflectivity using Infrared Thermographic Instrument

机译：使用红外热像仪定量评估偏振发射率和偏振反射率

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摘要

The infrared thermographic test has the advantages of safety, efficiency, and ease of use. However, the test is often subjected to environmental influences, which sometimes causes false detection of flaws. Background reflection from sunlight or neighboring structures is one of the major factors contributing to this issue. In most cases, the background reflection results in a higher temperature, which is recognized as a flaw indication. In this study, the authors apply a polarization theory to address the problem and propose a quantitative separation method of background reflection and flaw indication. As the first step of the study, the polarized emissivity and the polarized reflectivity were quantitatively evaluated. Based on these results, a quantitative extraction program for detection of flaws has been proposed.
机译：红外热成像测试具有安全，高效和易于使用的优点。但是，测试通常会受到环境的影响，有时会导致对缺陷的错误检测。阳光或邻近结构的背景反射是造成此问题的主要因素之一。在大多数情况下，背景反射会导致温度升高，这被认为是缺陷指示。在这项研究中，作者运用极化理论解决了这一问题，并提出了一种背景反射和缺陷指示的定量分离方法。作为研究的第一步，对偏振发射率和偏振反射率进行了定量评估。基于这些结果，提出了用于缺陷检测的定量提取程序。

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