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COTS – Harsh Condition Effects Considerations from Technology to User Level

机译：COTS –从技术到用户级别的严酷条件影响因素

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摘要

Radiation hardened devices are mostly extremely expensive. The continuously downscaling of microelectronic structures and the unavoidable presence of particle radiation on ground and in space leads to unwanted failures in electronic devices. Furthermore it is expected that in the next few years around 8000 new satellites will be launched around the world. Due to the enormous increasing need for Rad-Hard devices, there will be more focus on Commercial Of The Shelf (COTS) devices, which costs are lower. Also nowadays microelectronics for automotive systems are tested to withstand radiation especially SEU-single event upsets. It is clear that SEU cannot be ignored anymore especially in the application of unmanned autonomous vehicles and systems. Reliability testing is expensive and extremely time consuming. The use of COTS-Commercials of the shelf is the ultimate goal to reach. In this paper, an overview of radiation effects on different CMOS technologies used in COTS devices is given. These effects can be considered while selecting different functional equivalent COTS devices implemented with different technologies. Moreover, an overview of software techniques used in programmable commercial devices to reduce the radiation effects is also described.
机译：辐射硬化设备通常非常昂贵。微电子结构的不断缩小尺寸以及不可避免的在地面和太空中存在的粒子辐射会导致电子设备发生意外故障。此外，预计在未来几年内，全球将发射大约8000颗新卫星。由于对Rad-Hard设备的需求日益增长，因此将更加关注成本较低的商用货架（COTS）设备。如今，也已对用于汽车系统的微电子产品进行了测试，以承受辐射，特别是SEU单事件干扰。显然，特别是在无人驾驶自动驾驶汽车和系统的应用中，SEU不再被忽略。可靠性测试非常昂贵并且非常耗时。货架上使用COTS-Commercials是最终的目标。本文概述了辐射对COTS器件中使用的不同CMOS技术的影响。在选择采用不同技术实现的不同功能等效COTS设备时，可以考虑这些影响。此外，还描述了在可编程商用设备中用于减少辐射影响的软件技术的概述。

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