Erratum: Design of high-reliability LDO with current limiting characteristics with built-in new high tolerance ESD protection circuit [IEICE Electronics Express Vol. 10 (2013) No. 20 pp. 20130516]

Jin Woo Jung; Kwang Yeob Lee; Yong Seo Koo

首页> 外文期刊>IEICE Electronics Express >Erratum: Design of high-reliability LDO with current limiting characteristics with built-in new high tolerance ESD protection circuit [IEICE Electronics Express Vol. 10 (2013) No. 20 pp. 20130516]

【24h】

Erratum: Design of high-reliability LDO with current limiting characteristics with built-in new high tolerance ESD protection circuit [IEICE Electronics Express Vol. 10 (2013) No. 20 pp. 20130516]

机译：勘误表：采用内置的新型高容差ESD保护电路设计具有限流特性的高可靠性LDO。 10（2013）No. 20 pp。20130516]

获取原文

掌桥外文数据库（机构版） >>

开具论文收录证明 >>

文献代查 >>

页面导航

著录项
相似文献
相关主题

著录项

来源
《IEICE Electronics Express》 |2013年第21期|共页
作者
Jin Woo Jung; Kwang Yeob Lee; Yong Seo Koo;
展开▼
作者单位

展开▼
收录信息
原文格式 PDF
正文语种
中图分类通信;
关键词

相似文献

外文文献

1. Design of high-reliability LDO with current limiting characteristics with built-in new high tolerance ESD protection circuit [J] . Jin Woo Jung, Kwang Yeob Lee, Yong Seo Koo IEICE Electronics Express . 2013,第20期

机译：内置新型高容差ESD保护电路的具有限流特性的高可靠性LDO设计
2. Erratum: Unified active Q factor formula for use in noise spectrum estimation from Leeson’s and Hajimiri’s models [IEICE Electronics Express Vol. 10 (2013) No. 24 pp. 20130806] [J] . Takanari Minami, Takashi Ohira IEICE Electronics Express . 2014,第1期

机译：勘误表：统一的有源Q因子公式，用于根据Leeson和Hajimiri模型[IEICE Electronics Express Vol。 10（2013）No. 24 pp。20130806]
3. Erratum: The impact of trapping centers on AlGaN/GaN resonant tunneling diode [IEICE Electronics Express Vol. 10 (2013) No. 19 pp. 20130588] [J] . Haoran Chen, Jun Luo, Linapos, IEICE Electronics Express . 2013,第24期

机译：勘误表：陷阱中心对AlGaN / GaN共振隧穿二极管的影响[IEICE Electronics Express Vol。 10（2013）19号第20130588页]
4. Design of high-reliability LDO with current limiting characteristics with built-in new high tolerance ESD protection circuit [O] . Jin Woo Jung, Yong Seo Koo, Kwang Yeob Lee 2013

机译：具有电流限制特性的高可靠性LDO设计新型高公差ESD保护电路

Erratum: Design of high-reliability LDO with current limiting characteristics with built-in new high tolerance ESD protection circuit [IEICE Electronics Express Vol. 10 (2013) No. 20 pp. 20130516]

著录项

相似文献

相关主题

期刊订阅