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首页> 外文期刊>IEICE transactions on information and systems >An Efficient Test and Repair Flow for Yield Enhancement of One-Time-Programming NROM-Based ROMs
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An Efficient Test and Repair Flow for Yield Enhancement of One-Time-Programming NROM-Based ROMs

机译：用于一次性编程基于NROM的ROM的良率提高的有效测试和修复流程

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摘要

NROM is one of the emerging non-volatile-memory technologies, which is promising for replacing current floating-gate-based non-volatile memory such as flash memory. In order to raise the fabrication yield and enhance its reliability, a novel test and repair flow is proposed in this paper. Instead of the conventional fault replacement techniques, a novel fault masking technique is also exploited by considering the logical effects of physical defects when the customer's code is to be programmed. In order to maximize the possibilities of fault masking, a novel data inversion technique is proposed. The corresponding BIST architectures are also presented. According to experimental results, the repair rate and fabrication yield can be improved significantly. Moreover, the incurred hardware overhead is almost negligible.
机译：NROM是新兴的非易失性存储器技术之一，有望替代现有的基于浮栅的非易失性存储器，例如闪存。为了提高制造良率并提高其可靠性，提出了一种新颖的测试与修复流程。代替传统的故障替换技术，还可以通过在对客户的代码进行编程时考虑物理缺陷的逻辑影响来开发一种新颖的故障屏蔽技术。为了最大化故障屏蔽的可能性，提出了一种新颖的数据反演技术。还介绍了相应的BIST体系结构。根据实验结果，可以显着提高修复率和制造良率。而且，所产生的硬件开销几乎可以忽略不计。

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