New Analysis Methodology to Evaluate the Environmental Factors and the Deterioration of Metallic Surfaces in the Electronics Industry

Francisco Ramírez Moreno; Sebastián Velarde Córdova; Héctor Alej; ro Peláez Molina; Homero Jaime Rodríguez Centeno; Gustavo Lopez Badilla

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New Analysis Methodology to Evaluate the Environmental Factors and the Deterioration of Metallic Surfaces in the Electronics Industry

机译：评估电子工业中环境因素和金属表面恶化的新分析方法

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Based on the use of industrial and computing engineering tools, a new method was developed with a VEGAM matrix for the rapid and effective detection of the effects of the environment (climate and air pollution) on equipment and machines used in the electronics industry. This was done with a staff developed by experts from the National Technological Institute based in the Technological Institute of Mexicali, obtaining an efficiency of 95% in its application in the electronic industry of the city of Mexicali.

机译：基于工业和计算机工程工具的使用，开发了一种带有VEGAM矩阵的新方法，用于快速有效地检测环境（气候和空气污染）对电子工业中使用的设备和机器的影响。这是由位于墨西卡利技术研究所的国家技术研究所专家开发的人员完成的，在墨西卡利市电子行业中的应用效率达到95％。

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《International Journal of Advancements in Technology》 |2018年第4期|共6页
作者
Francisco Ramírez Moreno; Sebastián Velarde Córdova; Héctor Alej; ro Peláez Molina; Homero Jaime Rodríguez Centeno; Gustavo Lopez Badilla;
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New Analysis Methodology to Evaluate the Environmental Factors and the Deterioration of Metallic Surfaces in the Electronics Industry

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