Analyzing of Pseudo-Ring Memory Self- Testing Schemes with Algorithms

Ghenadie Bodean; Wajeb Gharibi

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Analyzing of Pseudo-Ring Memory Self- Testing Schemes with Algorithms

机译：伪环记忆自测方案的算法分析

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In this paper, scan and ring schemes of the pseudo-ring memory self-testing are investigated. Both schemes are based on emulation of the linear or nonlinear feedback shift register by memory itself. Peculiarities of the pseudo-ring schemes implementation for multi-port and embedded memories, and for register file are described. It is shown that only small additional logic is required and allows microcontrollers at-speed testing. Moreover, posteriori values are given for some types of memories faults coverage when pseudo-ring testing schemes are applied.

机译：本文研究了伪环形存储器自测试的扫描和环形方案。两种方案都基于存储器本身对线性或非线性反馈移位寄存器的仿真。描述了用于多端口和嵌入式存储器以及用于寄存器文件的伪环方案实现的特殊性。结果表明，只需要很小的附加逻辑就可以对微控制器进行全速测试。此外，当采用伪环测试方案时，对于某些类型的存储器故障覆盖范围，给出了后验值。

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《International Journal of Distributed and Parallel Systems》 |2012年第4期|共页
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Ghenadie Bodean; Wajeb Gharibi;
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中图分类 TP311.13;
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Analyzing of Pseudo-Ring Memory Self- Testing Schemes with Algorithms

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